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MicroNews Jul/Aug 1995

 
 

 

 

Microbeam Analysis Society

Micronews July/August 1995

 

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MEETING AND SHORT COURSE

CALENDAR

 

14TH INTERNATIONAL CONGRESS ON X-RAY OPTICS AND MICROANALYSIS

 

August 29 - September 2, 1995

GuangZhou, China

Contact: 8620-777-5213

8620-777-5791 FAX

 

3RD INTERAMERICAN CONGRESS OF ELECTRON MICROSCOPY

September 2 - 6, 1995

Caxambú MG, Brazil

Contact: Elliot Kitajima

55-61-3482424

55-61-3499094 FAX

 

NEW ZEALAND MICROSCOPY CONF. '95

September 4 - 8, 1995

Dunedin, New Zealand

Contact: Allan Mitchell

64 3 479 7301

64 3 479 7254 FAX

allan.mitchell@stonebow.otago.ac.nz

 

SURFACES IN BIOMATERIALS '95

September 6 - 9, 1995

Minneapolis, MN

Contact: Surfaces in Biomaterials Foundation

c/o ARDEL Management, PO Box 26111

Minneapolis, MN 55426-0111

(612) 927-6707

 

13TH INTERNATIONAL VACUUM CONGRESS, 9TH INTERNATIONAL CONFERENCE ON SOLID SURFACES

September 25 - 29, 1995

Yokohama, JAPAN

Contact: General Information / Congress Secretariat

International Communications Specialists, Inc.

2F Kasho Bldg., 2-14-9, Nihombashi,

Chuo-ku, Tokyo 103, Japan

81-3-3272-8013

81-3-3273-3520 FAX

 

 

14TH INTERNATIONAL EM CONGRESS

September 26 - October 2, 1995

Cancun, Mexico

Contact: Migel Jose Yacaman

525-570-85-03

525-570-85-03 FAX

 

SYMPOSIUM ON INTEGRATED MICROSCOPY

September 29 - October 1, 1995

Madison, WI

Contact: IMR, University of Wisconsin

1675 Observatory Drive

Madison, WI 53706

imradmin@calshp.cals.wisc.edu

 

14TH ANN. ADVANCES IN MICROSCOPY SYMP.; "MICROSCOPY OUTREACH: CONVEYING ITS SCIENCE, ART & TECHNOLOGY" (NCSMMA)

September 29 - October 1, 1995

Wrightsville, NC

Contact: Peter Ingram

(919) 541-6598

(919) 681-8419 FAX

ingram@rti.org

 

INTERNATIONAL SEMINAR ON QUANTITATIVE MICROSCOPY

October 4 - 5, 1995

Braunschweig, Germany

Contact: H. Geuther

49 531 592 4015 FAX

heinrich.geuther@ptb.de

 

6TH EUROPEAN CONF. ON APPLICATIONS OF SURFACE AND INTERFACE ANALYSIS

October 9 - 13, 1995

Montreux, Switzerland

Contact: H. J. Mathieu

Swiss Federal Inst. of Technology

Lausanne (EPFL), EPFL

LMCH-DMX, CH-1015

Lausanne, Switzerland

41 21 693 29 62

41 21 693 39 46 FAX

e-mail mathieu@lmch.dmx.epfl.ch

       
         

       

 

WINTER WORKSHOP ON ELECTRON DIFFRACTION AND IMAGING OF SURFACES

January 3 - 6, 1996

Scottsdale, AZ

Contact: Mrs. Sharon Willison

Center for Solid State Science

Arizon State University

Box 871704

Tempe, AZ 85287-1704

 

ACEM-14

Sponsored by Australian Society for Electron Microscopy, Inc., Microscopical Society of Australia, and International Union of Microbeam Analysis Societies

February 5 - 9, 1996

Sydney, Australia

Contact: ACEM-14 - microCOSMOPOLITAN

E. M. Unit

University of Sydney

NSW 2006

(+61 2) 351 2351

(+61 2) 552 1967

 

MICROSCOPY & MICROANALYSIS 96

Sponsored by MSA, MAS and MSC/SMC

Minneapolis, MN

 

MICROSCOPY & MICROANALYSIS 97

Cleveland, OH

ACSI-3, THE THIRD INTERNATIONAL SYMPOSIUM ON ATOMICALLY CONTROLLED SURFACES AND INTERFACES

October 12 - 14, 1995

Raleigh, NC

Contact: ACSI-3

College of Physical and Mathematical Sciences

North Carolina State University

Box 8201

Raleigh, NC 27695-8201

email: acsi3@ncsu.edu

 

AVS 42ND NATIONAL SYMPOSIUM

October 16 - 20, 1995

Minneapolis, MN

Contact: AVS

120 Wall Street

32nd Floor

New York, NY 10005

(212) 248-0200

e-mail: avsnyc@vacuum.org

 

MRS FALL MEETING

November 27 - December 2, 1995

Boston, MA

Contact: MRS, Meetings Department

9800 McKnight Road

Pittsburgh, PA 15237-6006

(412) 367-3003

(412) 367-4373 FAX

 
     
       

MAS EXECUTIVE COUNCIL

President

Jon McCarthy

NORAN Instruments, Inc.

2551 W. Beltline Highway

Middleton, WI 53562

(608)831-6511 FAX: (608)831-2313

 

Past-President

John A. Small

National Institute of Standards and Technology

Bldg. 222, Rm. A113

Gaithersburg, MD 20899

(301)975-3900 FAX: (301)216-1134

 

President-Elect

Dale E. Johnson

Graduate School AG-10

University of Washington

Seattle, WA 98195

(206)543-5900 FAX: (206)685-3234

 

Treasurer

Harvey A. Freeman

958 Long Pond Road

Brewster, MA 02631-1898

(508)896-9060

 

Secretary

David S. Simons

National Institute of Standards and Technology

Bldg. 222, Rm. A113

Gaithersburg, MD 20899

(301)975-3903 FAX: (301)216-1134

     
       

       

DIRECTORS

Joanna L. Batstone (1993-1995)

IBM T. J. Watson Research Center

P. O. Box 704

Yorktown Heights, NY 10598

(914)784-7674 FAX: (914)784-6324

 

Charles E. Lyman (1993-1995)

Department of Materials Science and Engineering

Whitaker Lab

5 East Packer Avenue

Lehigh University

Bethlehem, PA 18015

(215)758-4249 FAX: (215)258-4244

 

Paul F. Hlava (1994-1996)

Sandia National Laboratories

Department 1822, MS-0342

P.O. Box 5800

Albuquerque, NM 87185-0342

(505)844-1890 FAX: (505)844-1778 or 7910

Carol Swyt (1994-1996)

3E66 Building 13

BEIP / NCRR

NIH

Bethesda, MD 20892

(301) 975-3926 FAX: (301)216-1134

 

Joseph D. Geller (1995-1997)

One Intercontinental Way

Peabody, MA 01960

(508)535-5595 FAX: (508)535-7653

 

John F. Mansfield (1995-1997)

University of Michigan, North Campus

2455 Hayward

Ann Arbor, MI 48109-2143

(313)936-3352 FAX: (313)763-5567

     
       

ADDITIONAL MAS REPRESENTATIVES

Accountant, Dues and Mailing List

VCH Publishers, Inc.

303 NW 12th Avenue

Deerfield Beach, FL 33422-8824

(800)367-8249 FAX: (305)428-8201

 

Affiliated Regional Societies

Paul Hlava (see Directors)

 

Awards Committee for MAS 1995

Joanna L. Batstone (see Directors)

Charles E. Lyman (see Directors)

 

Computer Activities Committee

John F. Mansfield (see Directors)

Paul Carpenter

Email: PaulC@legs.caltech.edu

(818)356-6126 FAX: (818)568-0935

 

Conference Proceedings Inventory

C. Susskind

San Francisco Press, Inc.

Box 6800

San Francisco, CA 94101-6800

(510)524-1000

 

Corporate Liason Committee

Thomas G. Huber

JEOL (USA) Inc.

11 Dearborn Road

Peabody, MA 01960

(508)535-5900 FAX:(508)536-2205

Education Committee

Phillip E. Russell

Department of Materials Science and Engineering

P.O. Box 7916

North Carolina State University

Raleigh, NC 27695-7916

(919)515-7501 FAX: (919)515-2932

 

Finance Committee, Archivist

Gordon Cleaver

GE Vallecitos Nuclear Center

P. O. Box 460, MC V08

Pleasanton, CA 94566

(510)862-4320 FAX: (510)862-4244

 

Historian

Art Chodos

302 Acorn Circle

Monrovia, CA 91016-1807

(818)357-0183 FAX: (818)577-9246

 

International Liaison

David B. Williams

Department of Materials Science and Engineering

Whitaker Laboratory

5 East Packer Avenue

Lehigh University

Bethlehem, PA 18015-3195

(215)758-4224 FAX: (215)758-4244

 

Long Range Planning Committee

John A. Small (see Past-President)

       

       

 

MicroNews Editor

Inga Holl Musselman

Chemistry Program, BE 26

University of Texas at Dallas

P. O. Box 830688

Richardson, TX 75083-0688

(214)883-2706 FAX: (214)883-2925

 

Sustaining Membership Committee

Jack L. Worrall

CEMMA 103

University of Southern California

Los Angeles, CA 90089-0101

(213)740-1990

MAS-MSA Liason, Nominations and

Presidents Award

Jon McCarthy (see President)

 

Membership Services

Scott Wight

P.O. Box 3552

Gaithersburg, MD 20885

1-800-4-MASMEM

 

Microbeam Analysis Journal

Richard W. Linton, Editor-in-Chief

Department of Chemistry - CB3290

University of North Carolina

Chapel Hill, NC 27599-3290

(919)962-2152 FAX: (919)962-1547

 
     

AFFILIATED REGIONAL SOCIETIES

Full Name (Acronym)

Contact, Phone

MAS Director Assignment

 

Arizona Imaging and Microanalysis Society (AIMS)

Virginia Lindley, (509)325-6198

Lyman

 

Appalachian Region Electron Microscopy Society (AREMS)

Tom Richards, (704)364-8219

Swyt

 

Microbeam Analysis Society of Australia (AusMAS)

Clive Nockolds, 61-02-692-2351 FAX: 61-02-692-4671

none

 

Canadian Microbeam Analysis Society (CanMAS)

Rod Packwood, (613)992-2288 FAX: (613)992-8735

none

 

Cleveland Microbeam Analysis Society (CleveMAS)

James D. Eisner, (216)933-1605 FAX: (216)933-0563

Swyt

 

Colorado Microbeam Analysis Society (CoMAS)

Greg Meeker, (303)236-1081 FAX: (303)236-1414

Geller

 

Instrumental Analysis Society (IAS)

David Crawford, (412)325-1776

Lyman

 

Louisiana Society for Microscopy (LSM)

Owen Mills, (504)865-5142

Lyman

 

Metropolitan Microscopy Society (M2S)

John H. Weakliem, (609)924-7310

Batstone

 

Mid-Atlantic Microbeam Analysis Society (MAMAS)

Ryna Marinenko, (301)975-3901 FAX: (301)216-1134

Batstone

 

Microbeam Analysis Society of Southern California (MASSoC)

Paul Carpenter, (818)356-6126 FAX: (818)568-0935

Hlava

 

Michigan Electron Microscopy Society (MEMS)

John Mansfield, (313)936-3352 FAX: (313)763-5567

Mansfield

 

Missouri-Illinois-Kansas Microbeam Analysis Society (MIKMAS)

Lou Ross, (314)882-4777 FAX: (314)882-5458

Mansfield

 

Minnesota Microscopy Society (MMS)

Michael Coscio, (612)569-1331 FAX (612)569-1284

Mansfield

 

Microscopy Society of the Ohio River Valley (MSORV)

Scott Walck, (515)255-5791

Batstone

 

North Carolina Society for Electron Microscopy and Microbeam Analysis (NCSEMMA)

Peter Ingram, (919) 541-6598 FAX (919) 681-8419

Swyt

 

New England Society for Electron Microscopy (NESEM)

Linda Melanson, (617)736-2469 FAX: (617)736-2405

Geller

 

New Mexico Microbeam Users Group (NMMBUG)

Paul Frank Hlava, (505)844-1890 FAX: (505)844-1778

Geller

     
       

       

 

Oklahoma Microscopy Society (OMS)

Dean Phillips, (918)661-8733 FAX: (918)622-1097

Hlava

 

SouthEastern Microscopy Society (SEMS)

Joan Hudson, (803)656-2465 FAX: (803)656-2466

Swyt

 

West Coast Microbeam Analysis Society (WestMAS)

Charles Gordon Cleaver, Jr., (510)862-4320 FAX: (510)862-4516

Hlava

     

SUSTAINING MEMBERS

Our Sustaining Members Contribute Substantial Support to MAS

4pi Analysis, Inc.

(919)489-1757 FAX: (919)489-1487

Contact: Michael Czysz / Scott Davilla

Mac-based EDS & Imaging, Hard- and Software

 

Advanced MicroBeam, Inc.

(216)394-1255 FAX: (216)394-1834

Contact: Donald P. Lesher

Microprobe Service, Automation, Image Analysis

 

Amray, Inc.

(617)275-1400 FAX: (617)275-0740

Contact: Kenneth Benoit / Sheldon Moll

Manufacturer of Scanning Electron Microscopes

 

Cameca Instruments, Inc.

(203)459-0623 FAX: (203)261-5506

Contact: Andrew Davis / Claude Conty

EPMA, SIMS, Analytical SEM, and FE/Auger

 

Charles Evans & Associates

(415)369-4567

Contact: Jeff Kingsley / Mike Edgell

Service Analysis Lab., Mass Spec., RBS

 

Dapple Systems

(408)733-3283 FAX: (408)736-2350

Contact: William Stewart

EDS Systems, Image Capture and Analysis

 

Denton Vacuum, Inc.

(609)439-9100 FAX: (609)439-9111

Contact: George Lutz / James L. Campbell

Vacuum Coaters and Critical Point Dryers

 

EDAX International

(210)529-6277 FAX: (201)529-3156

Contact: Tony Williams / Paul Oravitz

Microanalysis Systems Utilizing PC or MAC

 

Electron Microscopy Sciences / Diatome US

(800)523-5874 (215)646-1566 FAX: (215)646-8931

Contact: Carole March / Stacie Kirsch

EM and LM Supplies and Diamond Knives

 

ETP-USA / Electron Detectors, Inc.

(510)449-8534 FAX: (510)449-8996

Contact: Robert J. Ruscica

Robinson BSE Det. & Infrared Chamberview Sys.

FEI Company

(503)640-7500 FAX: (503)640-7509

Contact: Andree Kraker / Doug Rathkey

LaB6 & CeB6 Tips, FIB & FIB/SEM Workstations

 

Fisons Instruments

(805)295-0019 FAX: (805)295-8714

Contact: Joe Robinson / Mike Davidson

Energy-dispersive X-ray Analysis Systems

 

Gatan, Inc.

(510)463-0200 FAX: (510)463-0204

Contact: Peter Swann / Christopher Byrne

TEM Accessories and Specimen Prep. Equipment

 

Geller MicroAnalytical Laboratory

(800)MICRO-LL (508)887-7000 FAX: (508)887-6671

Contact: Joseph D. Geller / Charles Herrington

EPMA,SEM/EDS,& Auger Services-EM Standards

 

Hessler Technical Services

(203)358-0266 FAX: (203)358-0266

Contact: Robert Hessler

Sales and Marketing Representative

 

JEOL USA, Inc.

(508)535-5900 FAX: (508)536-2205

Contact: Robert Santorelli / Charles Nielsen

EPMA, Auger, SEM, TEM, NMR, Mass Spec

 

RJ Lee Instruments Ltd.

(412)744-0100 FAX:(412)744-0506

Contact: David Crawford / Dr. Fred Schamber

PERSONAL SEM for failure analysis, QA, etc.

 

Lehigh University

(610)758-4249 FAX:(610)758-4244

Contact: David Williams / Charles Lyman

Education in SEM, AEM, AFM, & Microanalysis

 

Leica, Inc.

(800)248-0123 (708)405-0123 FAX: (708)317-7268

Contact: Kevin Dauwalter / Norm Burns

SEM, Optical, & Scanning Confocal Microscopes

 

Materials Analytical Services, Inc.

(800)421-8451 (404)448-3200 FAX: (404)368-8256

Contact: Mark Rigler / Bill Longo

FTIR,EDXRF,S(TEM),SEM,FIB,STM&XRD Serv.

       

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