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MicroNews May/Jun 1995

     
 

 

 

Microbeam Analysis Society

Micronews May/June 1995

 
         

 PRESIDENT'S MESSAGE

 

Dear Members:

 

As I write these words in mid-April, the final preparations for the annual MAS meeting are in place. This issue of MicroNews brings to you the complete program and agenda for the meeting. If you have not made plans to attend this meeting, I invite you to review the materials in this issue and urge you to make your reservations next week. As you can see, our local arrangements and program committees have organized an outstanding scientific and social program for the week. Make your plans now to join your colleagues in Breckenridge, CO!

 

As the organizer of this years Presidential Symposium, I extend my personal invitation to each of you to attend the symposium. In addition to a review of some exciting emerging technology that may impact the those of us who use x-ray detectors, the 1995 MAS awards ceremony will be held in conjunction with the symposium. At the ceremony, I have the pleasure of distributing the best paper awards for the previous year, honoring the MAS student scholars selected for the 1995 meeting, and presenting the Presidential Awards for Science, Service and the Heinrich award.

 

One of the more pleasant tasks for the president of this society is the selection of the recipients of the Presidential Awards. Each award recognizes a member of our society who has made a special contribution to the society or to the field of microbeam analysis. The Science Award recognizes significant contributions to the field of microbeam analysis. The Service Award recognizes one of our members for outstanding service to the society. Finally, the Heinrich Award is presented to a young scientist under 40 who has made outstanding contributions to the field of microanalysis. As I write these words, I have submitted candidates for the awards to Council for approval. Join us at the meeting in August to congratulate all the award winners!

 

 

 

 

 

 

On a sad note, I wish to call your attention to the unexpected and untimely death of Mort Maser. You will find a more complete summary of Mort's accomplishments elsewhere in this issue of MicroNews. Mort was very active in our sister society MSA, and in the organization of the joint MSA/MAS meetings. His work touched many of the members of our own society, as well as in the international microscopy community. He will be missed. Your MAS Council has authorized a contribution to the Morton D. Maser Scholarship Fund on behalf of our society.

 

Finally, as the end of my service as your president rapidly approaches, I want to thank so many of you for your very special help during this year. I especially wish to thank the council and all our committee members for their efforts and support. I sincerely hope that each of you will enjoy such a humbling yet magnificent experience in your own career.

 

Jon J McCarthy

President

       
   

MEETING AND SHORT COURSE

CALENDAR

 

Meetings

 

STM '95

July 23 - 28, 1995

Aspen, CO

Contact: Dr. Richard Colton

Code 6177

Naval Research Lab

Washington, DC 20375

(202) 767-0801

(202) 767-3321 FAX

e-mail: rcolton@stm2.nrl.navy.mil

 

MICROBEAM ANALYSIS SOCIETY (MAS)

NATIONAL MEETING

August 6 - 11, 1995

Breckenridge, CO

Contact: Gregory Meeker

United States Geological Survey

P. O. Box 25046, MS 903

Denver Federal Center

Denver, CO 80225

(303) 236-1081

(303) 236-1414 FAX

e-mail: gmeeker@usgsprobe.cr.usgs.gov

       
         

       

 

6TH EUROPEAN CONFERENCE ON APPLICATIONS OF SURFACE AND INTERFACE ANALYSIS

October 9 - 13, 1995

Montreux, Switzerland

Contact: H. J. Mathieu

Swiss Federal Inst. of Technology

Lausanne (EPFL), EPFL

LMCH-DMX, CH-1015

Lausanne, Switzerland

41 21 693 29 62

41 21 693 39 46 FAX

e-mail mathieu@lmch.dmx.epfl.ch

 

ACSI-3, THE THIRD INTERNATIONAL SYMPOSIUM ON ATOMICALLY CONTROLLED SURFACES AND INTERFACES

October 12 - 14, 1995

Raleigh, NC

Contact: ACSI-3

College of Physical and Mathematical Sciences

North Carolina State University

Box 8201

Raleigh, NC 27695-8201

email: acsi3@ncsu.edu

 

AVS 42ND NATIONAL SYMPOSIUM

October 16 - 20, 1995

Minneapolis, MN

Contact: AVS

120 Wall Street

32nd Floor

New York, NY 10005

(212) 248-0200

e-mail: avsnyc@vacuum.org

 

ACEM-14

Sponsored by Australian Society for Electron Microscopy, Inc., Microscopical Society of Australia, and International Union of Microbeam Analysis Societies

February 5 - 9, 1996

Sydney, Australia

Contact: ACEM-14 - microCOSMOPOLITAN

E. M. Unit

University of Sydney

NSW 2006

(+61 2) 351 2351

(+61 2) 552 1967

 

MICROSCOPY & MICROANALYSIS 96

Sponsored by MSA, MAS and MSC/SMC

Minneapolis, MN

 

MICROSCOPY & MICROANALYSIS 97

Cleveland, OH

42ND INTERNATIONAL FIELD EMISSION SOCIETY MEETING

August 6 - 11, 1995

Madison, WI

Contact: Prof. Thomas Kelly

U. of Wisconsin

1500 Johnson Drive

Madison, WI 53706

(608) 263-1073

e-mail: ifes95@engr.wisc.edu

 

MICROSCOPY SOCIETY OF AMERICA (MSA) / HISTOCHEMICAL SOCIETY ANNUAL MEETING

August 13 - 17, 1995

Kansas City, MO

Contact: MSA Business Office

P. O. Box MSA

Woods Hole, MA 02543

(800) 538-3672

(508) 548-9053 FAX

 

14TH INTERNATIONAL CONGRESS ON X-RAY OPTICS AND MICROANALYSIS

August 29 - September 2, 1995

GuangZhou, China

Contact: 8620-777-5213

8620-777-5791 FAX

 

3RD INTERAMERICAN CONGRESS OF

ELECTRON MICROSCOPY

September 2 - 6, 1995

Caxambú MG, Brazil

Contact: Elliot Kitajima

55-61-3482424

55-61-3499094

 

13TH INTERNATIONAL VACUUM CONGRESS, 9TH INTERNATIONAL CONFERENCE ON SOLID SURFACES

September 25 - 29, 1995

Yokohama, JAPAN

Contact: General Information / Congress Secretariat

International Communications Specialists, Inc.

2F Kasho Bldg., 2-14-9, Nihombashi,

Chuo-ku, Tokyo 103, Japan

81-3-3272-8013

81-3-3273-3520 FAX

 

14TH INTERNATIONAL EM CONGRESS

September 26 - October 2, 1995

Cancun, Mexico

Contact: Migel Jose Yacaman

525-570-85-03

525-570-85-03 FAX

 
     
       

       

MORTON D "MORT" MASER

 

Morton D "Mort" Maser, President of Woods Hole Educational Associates, and Executive Secretary to Council of both the Electron Microscopy Society of America and the Histochemical Society, died on Saturday, March 18, 1995 at the age of 60.

 

He earned his A.B. from the University of Pennsylvania in 1955, and his Ph.D. in biophysics from the University of Pittsburgh in 1962. He held research and faculty positions at the Mellon Institute, Harvard University, the Millard Fillmore Hospital, Northeastern University, Creighton University, and the Marine Biological Laboratory.

 

He developed roughly 100 short courses in electron microscopy and related fields for scientists and technicians, and made more than 50 contributions to peer-reviewed publications on electron microscopy and related topics.

 

He was a member of several professional societies including serving as Chair of EMSA's Education Committee; past President, Director of the New England Society for Electron Microscopy; the American Association for the Advancement of Science; American Society of Cell Biology; and the International Society for Stereology.

 

His research has spanned the sciences from electron microscopical techniques, to computer sciences, to software systems.

 

He is survived by his wife, Naomi, children Larry of Forestdale, Massachusetts and Jill, of Philadelphia, and grandson, Benjamin.

 

Memorial services celebrating his life are being planned for the summer months. Details will be announced as they are finalized.

 

In memory of Mort, his family is establishing the Morton D Maser Scholarship Fund. Contributions can be sent to: Larry Maser, P.O. Box EM, Woods Hole, MA 02543. Please designate your gift to the Morton D Maser Scholarship Fund.

MAS 1995 TOUR SPEAKER SCHEDULE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Respectfully submitted,

Paul F. Hlava, MAS Tour Speaker Coordinator

Sandia National Laboratories

Department 1822, MS-0342

P.O. Box 5800

Albuquerque, NM 87185-0342

Phone (505) 844-1890, FAX (505) 844-1778

     
       

Geller MicroAnalytical Laboratory

 

On May 1, 1995, Geller MicroAnalytical Laboratory moved to a larger space!

 

Geller MicroAnalytical Laboratory

426E Boston Street

Topsfield, MA 01983-1200

(800)MICRO-LL (508)887-7000 FAX: (508)887-6671

email: geller@world.std.com

   
       

       

two swimming pools, several hot tubs and saunas, tennis courts, and an indoor miniature golf course and electronic game room. Beaver Run Resort is located at the Southwest end of Breckenridge. Free shuttle buses to Main Street are provided by the conference center. The village runs free shuttle service to Main Street as well as to many of the activity sites in the vicinity.

 

Schedule of Scientific Program

Mon Aug 7, AM :

Presidential Symp: "Emerging Detector Technology for X-Ray Spectroscopy"

Session: "MALDI in Microanalysis"

Session: "Scanning Probe Microscopy", Part 1

Session: "Secondary Ion Mass Spectrometry"

 

Mon Aug 7, PM :

Session: "AEM - Part 1: New High-Resolution Instrumentation"

Session: "Highlights in Classic Light Microscopy"

Session: "Micro-Fluorescence/Luminescence Instrumentation & Applications"

Session: "Scanning Probe Microscopy", Part 2

 

Tue Aug 8, AM:

Session: "AEM - Part 2: New Techniques & Applications"

Session: "Infrared and Raman Microanalysis", Part 1

Session: "Micro-XRD/XRF / Chemical State", Part 1

Session: "Detection and Analysis of Soft X-Rays"

 

Concurrent Open Workshops:

"Computer Demonstrations / Software Exchange"

"Communications on Microanalysis over Internet"

 

Tue Aug 8, PM

Session: "Biological AEM - Part 1: X-Rays"

Session: "Infrared and Raman Microanalysis", Part 2

Session: "Micro-XRD/XRF / Chemical State", Part 2

Session: "Quantitative X-Ray Microanalysis", Part 1

 

Concurrent Open Workshops:

"Computer Demonstrations / Software Exchange"

"Communications on Microanalysis over Internet"

 

Wed Aug 9, AM

Session: "Biological AEM - Part 2: EELS"

Session: "Quantitative X-Ray Microanalysis", Part 2

Session: "Sample Preparation for Microanalysis"

Session: "Microanalysis for Nanotechnology"

 

Concurrent Open Workshops:

"Computer Demonstrations / Software Exchange"

"Communications on Microanalysis over Internet"

 

Bring the whole family to:

The National Meeting

of the

MICROBEAM

 

ANALYSIS

 

SOCIETY

 

1995

Beaver Run Resort

 

Breckenridge

Colorado

 

August 6-11, 1995

 

 

 

Location

Breckenridge is a historic Victorian mining town approximately 90 minutes west of Denver, in the heart of the Colorado Rocky Mountains. This quaint town sits in a beautiful valley surrounded by majestic mountain peaks on the western slope of the continental divide. Breckenridge has been fully and beautifully restored and provides a full range of restaurants, picturesque shops and innumerable outdoor activities. The meeting headquarters is Beaver Run Resort, a year-round hotel, resort and conference center. The facility houses restaurants, a nightclub, a deli, shops,

 
     
       

           
 
           
 

 

Wed Aug 9, PM

Afternoon free for Social Activities

 

Thu Aug 10, AM

Session: "AEM - Part 3: EELS of Interfaces"

Workshop: "Electron Beam/Specimen Interaction Modeling in the SEM"

Session: "The New Moon After Apollo"

Session: "Environmental Scanning Electron Microscopy"

 

Concurrent Open Workshops:

"Computer Demonstrations / Software Exchange"

"Communications on Microanalysis over Internet"

 

NOONTIME: MAS Business Meeting (Brown Bag Lunch)

 

Thu Aug 10, PM

Session: "AEM - Part 4: EELS Theory and Applications"

Session: "Computational Methods in Microscopy"

Session: "Advances in Scanning Electron Microscopy"

Session: "Chemometric Techniques for Spectral Analysis"

 

Concurrent Open Workshops:

"Computer Demonstrations / Software Exchange"

"Communications on Microanalysis over Internet"

 

Fri Aug 11, AM

Session: "Microprobe Applications in Materials Science"

Session: "Microanalytical Applications in the Geosciences"

Session: "New and Emerging Techniques"

Session: "Image Processing & Multivariate Image Analysis in Microscopy"

Workshop: "Standardization and Quality Assurance in Microanalysis"

 

*** Conference concludes ***

 

Fri Aug 11, PM

No sessions scheduled

 

SCIENTIFIC PROGRAM

 

WORKSHOPS:

 

Concurrent Open Workshops:

Computer Demonstrations / Software Exchange

Chairs: J. F. Mansfield, University of Michigan, Ann Arbor, MI

N. J. Zaluzec, Argonne National Laboratory, Argonne, IL

     

Communications on Microanalysis over Internet

Chair: N. J. Zaluzec, Argonne National Laboratory, Argonne, IL

The Development of an Electronic Microscopy & Microanalysis Journal on the WorldwideWeb. J. F. Mansfield, Electron Beam Microanalysis Lab., University of Michigan, Ann Arbor, MI.

 

Thursday, August 10, AM

Electron Beam/Specimen Interaction Modeling for Metrology and Microanalysis in the Scanning Electron Microscope II

Chairs: M. T. Postek, D. E. Newbury and J. R. Lowney, NIST, Gaithersburg, MD

Simulation of X-Ray and Backscattered SEM Images (Invited). R. Gauvin, D. Drouin and P. Hovington, Département de Génie Mécanique, Université de Sherbrooke, Sherbrooke, Québec, Canada.

 

Exploring the Possibilities of Low Energy SEM with a Specialized Monte Carlo Program. P. Hovington, D. Drouin, R. Gauvin, D. C. Joy, S. Luo and N. Evans, Department of Mechanical Engineering, Université de Sherbrooke, Sherbrooke, Québec, Canada and EM Facility, University of Tennessee, Knoxville, TN.

 

Workshop Report 1: Scanning Electron Microscope Metrology as Related to a Defined Edge Structure. M. T. Postek, A. E. Vladar, G. W. Banke, and T. W. Reilly, NIST, Gaithersburg, MD, IBM Corp., Essex Junction, VT and Hitachi Instruments, Mountain View, CA.

 

Workshop Report 2: Monte-Carlo Models for Predicting Edge Positions from Scanning Electron Microscope Signals. J. R. Lowney, G. W. Banke, R. Gauvin, D. C. Joy, J. Nunn, Z. Radzimski, and R. Sartore, National Institute of Standards and Technology, Gaithersburg, MD, Université de Sherbrooke, Québec, Canada and University of Tennessee, Knoxvile, TN.

 

Workshop Report 3: Edge Positions from Scanning Electron Microscope Signals by Comparing Models with Measurements. J. R. Lowney, M. T. Postek, and A. E. Vladar, National Institute of Standards and Technology, Gaithersburg, MD.

 

Monte Carlo Calculations of Thin Films on Substrates: A Round Robin Study of Chromium on Gallium Arsenide - Part 1, Measurements. D. E. Newbury and J. R. Michael, NIST, Gaithersburg, MD and Sandia National Lab. Albuquerque, NM.

 

Diagnostics for Monte Carlo Electron Beam Interaction Modeling: Range, Backscattering Coefficient and Electron Distribution. R. G. Sartore, U.S. Army Research Laboratory, Fort Monmouth, NJ.

       
           

       

 

Friday, August 11, AM

Standardization and Quality Assurance in Micro-Analysis (ISO Issues)

Chairs: D. E. Newbury, E. B. Steel, and R. L. Myklebust, NIST, Gaithersburg, MD

 

SESSIONS:

 

Monday, August 7, AM

PRESIDENTIAL SYMPOSIUM:

Emerging Detector Technology for X-Ray Spectroscopy

Chair: J. J. McCarthy, MAS President, Noran Instruments, Inc., Madison, WI

Status of Compound High-Z Semiconductor Detectors for X-Ray Spectroscopy (Invited). B. E. Patt and J. S. Iwanczyk, Xsirius, Inc. Camarillo, CA.

 

Low Temperature X-Ray Detectors with 10-20 eV Resolution and High Count Rates (Invited). J. Martinis, National Institute of Standards and Technology, Boulder, CO.

 

X-Ray Microanalysis using a High Resolution, Broad Band Microcalorimeter (Invited). E. Silver, M. LeGros, N. Madden and J. Beeman, Lab. for Experimental Astrophysics, Lawrence Livermore Nat'l Lab. and Lawrence Berkeley Laboratory, Berkeley, CA.

 

Soft X-Ray Diffraction / X-Ray Fluorescence CCD Instrument. J. Janesick, A. Collins and D. Blake, Jet Propulsion Laboratory, California Institute of Technology, and NASA-Ames Research Center, Moffett Field, CA.

 

New Technology for Room Temperature Silicon X-Ray Detectors (Invited). F. Olschner, K. S. Shah, R. Farrell and M. R. Squillante, Radiation Monitoring Devices, Inc., Watertown, NY.

 

Silicon Drift Chamber Detectors and Fully Depleted CCDs for Low Energy X-Ray Spectroscopy (Invited). P. Rehak, Instrumentation Division, Brookhaven National Laboratory, Upton, NY.

 

Monday, August 7, AM

Matrix-Assisted Laser Desorption Ionization Mass Spectrometry in Microanalysis

Chairs: A. Vertes, George Washington University, Washington, DC

J. Callahan, Naval Research Laboratory, Washington, DC

Fundamental Studies of Matrix-Assisted Laser Desorption Ionization (Invited). D. H. Russell, Lab. for Biological Mass Spectrometry, Department of Chemistry, Texas A&M University, College Station, TX.

 

MALDI-TOF and MALDI-FTMS Studies of Oligosaccharide Interactions with Metals. C. Holliman, M. Shahgholi, M. Ross, S. McElvany and J. Callahan, Chemistry Division, Naval Research Laboratory, Washington, DC.

 

Laser Microprobe Analysis of Particles Collected in a Flame. R. A. Fletcher, R. A. Dobbins and W. Lu, Surface and Microanalysis Science Division, NIST, Gaithersburg, MD and Division of Engineering, Brown University, Providence, RI.

 

9-Anthracenecarboxylic Acid: A New Matrix for Matrix-Assisted Laser-Desorption Ionization Analysis of Synthetic Polymers. X. Tang and A. Vertes, The George Washington University, Washington, DC.

 

Crystallization, Volatilization, and Ionization in Matrix-Assisted Laser Desorption. A. Bencsura, M. Sadeghi, Z. Olumee and A. Vertes, Dept. of Chemistry, Catholic University and Dept. of Chemistry, George Washington University, Washington, DC.

 

Surface-Enhanced Laser Desorption/Ionization (SELDI): Probe Surfaces Enhanced for Affinity Capture (SEAC) of Energy Absorbing Molecules (EAM) for Neat Desorption (SEND) of Intact Biopolymers. T. W. Hutchens, T.-T. Yip, J. Ching and P. Bardel, Department of Food Science and Technology, University of California, Davis, CA.

 

The Role of Solubility in the Analysis of Synthetic Polymer Materials by Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometry. R. C. King, R. Goldschmidt, Y. Xiong, K. G. Owens and S. D. Hanton, Department of Chemistry, Drexel University, Philadelphia, PA and Air Products and Chemicals, Inc., Allentown, PA.

 

Monday, August 7, AM

Secondary Ion Mass Spectrometry

Chair: S. Asher, National Renewable Energy Lab, Golden, CO

Molecular Surface Analysis by TOF-SIMS (Invited). S. R. Bryan, P. McKeown and B. W. Schueler, Physical Electronics Inc., Eden Prairie, MN and Redwood City, CA.

 

Scanning Focused Ion Beam Dissection, Microscopy and Analysis (Invited). P. Echlin and N. Dawes, School of Biological Sciences, University of Cambridge, Cambridge and FEI Europe Ltd., Cambridgeshire, England, U.K.

 

Oxide Formation on Liquid Metal: Imaging SIMS Studies of a Dynamic Microscopic System. J. M. Chabala, L. Wang and R. Levi-Setti, Enrico Fermi Institute and Dept. of Physics, The University of Chicago, Chicago, IL.

     
       

       

 

The Depth Measurement of Craters Produced by Secondary Ion Mass Spectrometry - Results of a Stylus Profilometer Round-Robin Study. D. S. Simons, Chemical Science and Technology Laboratory, NIST, Gaithersburg, MD.

 

Ion Implantation of Sulfur into Superalloys and its Detection with SIMS. J. K. Steele, W. P. Allen, J. Baltrush, C. H. Koch, L. S. Lin, A. V. Manzione and D. I. Potter, Metals Research Labs, Olin Corp., New Haven, CT, United Technologies Research Labs, East Hartford, CT, and Metallurgy Dept of University of Connecticut, Storrs, CT.

 

Absolute Calibration of SIMS Depth Profiles of a-SiNx:H/a-Si:H and a-SiOx:H/a-Si:H Multilayers. J. Li, J. M. Chabala and R. Levi-Setti, Enrico Fermi Institute, The University of Chicago, Chicago, IL.

 

Monday, August 7, AM and PM

Scanning Probe Microscopy

Chairs: P. J. Moyer, TopoMetrix, Santa Clara, CA

Y. E. Strausser, Digital Instruments, Santa Barbara, CA

Near-Field Scanning Optical Microscopy with Single Molecule Sensitivity (Invited). W. P. Ambrose, P. M. Goodwin, J. A. Schecker, R. L. Affleck, J. T. Petty, M. Wu, J. C. Martin and R. A. Keller, Chemical Science and Technology Division, Los Alamos Nat'l Lab., Los Alamos, NM and the University of New Mexico, Albuquerque, NM.

 

Progress in Applications of Near-Field Scanning Optical Microscopy (NSOM). P. J. Moyer, TopoMetrix, Santa Clara, CA.

 

Spectroscopy and Dynamics of Nanostructured J-Aggregates Probed by Near-Field Scanning Optical Microscopy. P. F. Barbara, D. A. Higgins and P. J. Reid, Department of Chemistry, University of Minnesota, Minneapolis, MN.

 

Exploring Cell and Biomolecular Structure with Scanning Force Microscopy (Invited). D. Braunstein and A. Spudich, Park Scientific Instruments, Sunnyvale, CA and Department of Biochemistry, Stanford University, Stanford, CA.

 

Touching on the Nanometer Scale: A Virtual Reality Interface for Scanning Probe Microscopy (Invited). R. Superfine, M. Falvo, S. Washburn, M. Finch, V. L. Chi, R. M. Taylor III and R. S. Williams, Departments of Physics and Astronomy and Computer Science, University of North Carolina, Chapel Hill, NC.

 

Optical and Structural Properties of Langmuir-Blodgett Films at the Air/Water and the Solid/Air Interface (Invited). L. M. Eng, Ch. Seuret and P. Guenter, Institute of Quantum Electronics, ETH Hoenggerberg, Zuerich, Switzerland.

 

Microelectromechanical Scanning Probe Microscopes. S. A. Miller, Y. Xu and N. C. MacDonald, Cornell University, Ithaca, NY.

 

Characterization of Modified Ceramic Fiber Surfaces using AFM. C. L. Arnold, K. L. More and E. Lara Curzio, Tennessee Technological University, Cookeville, TN and Oak Ridge National Lab., Oak Ridge, TN.

 

Controlled Bias Ramping for Scanning Tunneling Microscopy of Molecular Adsorbates. J. S. Roach, J. Honeyman and I. H. Musselman, Programs in Chemistry, University of Texas at Dallas, Richardson, TX and Digital Instruments, Inc., Santa Barbara, CA.

 

BioTips and Molecular Force Detection (Invited). E. Henderson, Department of Zoology and Genetics, Iowa State University, Ames, IA.

 

Monitoring the Growth of Epitaxial Films using Atomic Force Microscopy. Y. E. Strausser, J. T. Thornton and K. J. Kjoller, Digital Instruments, Santa Barbara, CA.

 

Monday, August 7, PM

Analytical Electron Microscopy - Part 1: New High-Resolution Instrumentation

Chair: R. D. Leapman, NIH, Bethesda, MD

Integrated NanoAnalytical Techniques and Tele-Presence Microscopy at the ANL Advanced Analytical Electron Microscope (Invited). N. J. Zaluzec, Materials Science Division, Argonne National Laboratory, Argonne, IL.

 

Materials Characterization with a Field-Emission Transmission Electron Microscope (Invited). L. E. Thomas, L. A. Charlot and J. S. Vetrano, Pacific Northwest Laboratory, Richland, WA.

 

Quantitative Electron Diffraction and Applications to Materials Science (Invited). J. M. Zuo, R. Holmestad, J. C. H. Spence and R. Hoier, Arizona State University, Tempe, AZ and University of Trondheim-NTH, Trondheim, Norway.

 

Spatial Resolution in EFTEM Elemental Maps (Invited). O. L. Krivanek and M. K. Kundmann, Gatan Research and Development, Pleasanton, CA.

 

Desktop Energy-Filtered Transmission Electron Microscopy. M. K. Kundmann, S. L. Friedman, B. Kraus and O. L. Krivanek, Gatan Research and Development, Pleasanton, CA and Dept. of Applied Physics, Stanford University, Stanford, CA.

     
       

       

 

Monday, August 7, PM

Highlights in Classic Light Microscopy

Chair: S. Palenik, Microtrace, Inc., Elgin, IL

Authentication of Art Objects: Shroud of Turin (Invited). W. C. McCrone, McCrone Research Institute, Chicago, IL.

 

A Technique for Examining Small Defects in or Beneath Coatings (Invited). Anna S. Teetsov, McCrone Associates, Inc., Westmont, IL.

 

The Forensic Investigation of Particles Recovered from Surfaces (Invited). S. Palenik, Microtrace, Elgin, IL.

 

The Role of Light Microscopy in Infrared Microspectroscopy (Invited). J. A. Reffner, Spectra-Tech, Inc., Shelton, CT.

 

The Intelligent Use of Interference Figures in Crystal Identification by Polarized Light Microscopy (Invited). Shu-Chun Su, Research Center, Hercules Inc., Wilmington, DE.

 

Analysis of the Tremolite/Actinollite Series using High Precision Refractive Index Measurements. J. R. Verkouteren, A. G. Wylie, E. B. Steel and M. S. Lim, Surface and Microanalysis Science Division, NIST, Gaithersburg, MD and Dept. of Geology, University of Maryland, College Park, MD.

 

Monday, August 7, PM

Microfluorescence/Luminescence Instrumentation and Applications

Chair: D. R. Tallant, Sandia National Labs, Albuquerque, NM

Quantitative Fluorescence Imaging of Thin Films using Tunable Filter Technology (Invited). P. J. Treado and H. B. Morris, Department of Chemistry, University of Pittsburgh, Pittsburgh, PA.

 

Probing Biosensor Interfaces using Time-Resolved Fluorescence Spectroscopy (Invited). F. V. Bright, R. A. Dunbar, U. Narang, J. S. Lundgren and J. D. Jordan, Department of Chemistry, Natural Sciences and Mathematics Complex, State University of New York at Buffalo, Buffalo, NY.

 

Application of Cathodoluminescence Defectoscopy in the Study of Indented MgO Crystals (Invited). M. V. Nazarov and T. A. Nazarova, Technical University of Moldova, Kishinev, Moldova.

 

Cathodoluminescence Studies of Materials for Use in Optical Display Devices. P. J. Wright, Scientific Research Instruments Division, Oxford Instruments Ltd., Oxfordshire, U.K.

 

A Correlation of CL Emissions from Penrith Sandstone with Elemental Distributions obtained by Simultaneous SEM-CL and EDS Analysis. P. J. Wright, Scientific Research Instruments Division, Oxford Instruments Ltd., Oxfordshire, U.K.

 

Identification of Radiative Recombination Centers in Ti: a- Al2O3 using Cathodoluminescence Irradiation Kinetics. M. R. Phillips, A. R. Moon and M. A. Stevens Kalceff, Electron Microscope Facility, University of Technology, Sydney, Australia.

 

Cathodoluminescence Characterization of Non-Bridging Oxygen Hole Centers in Quartz. M. A. Stevens Kalceff and M. R. Phillips, Electron Microscope Facility, University of Technology, Sydney, Australia.

 

Study of Effects of Chemistry, Surface States, and Confinement on the Wavelength and Lifetime of Emission from Si Nanocrystals. E. W. Forsythe, J. Mattheis, F. Adar, D. Morton, B.-S. Sywe and G. S. Tompa, Physics Dept., Stevens Institute of Technology, Hoboken, NJ, ISA/SPEX Industries, Inc., Edison, NJ and Army Research Labs, Fort Monmouth, NJ.

 

Tuesday, August 8, AM

Analytical Electron Microscopy - Part 2: New Techniques and Applications

Chair: C. Colliex, Université de Paris - Sud, Orsay, France

Experimental Determination of Structural Units at [001] Tilt Boundaries in SrTiO3 (Invited). N. D. Browning, M. M. McGibbon, M. F. Chisholm and S. J. Pennycook, University of Illinois, Chicago, IL and Oak Ridge National Laboratory, Oak Ridge, TN.

 

Mass Measurement in Sub-Nanometer Clusters by Z-Contrast Microscopy. A. Singhal, J. M. Gibson and M. M. J. Treacy, University of Illinois, Urbana, IL and NEC Research Institute, Princeton, NJ.

 

Energy-Filtering Microscopy of Semiconductor Devices. J. A. Hunt and A. C. Lam, Gatan Research & Development, Pleasanton, CA and Intel Corporation, Santa Clara, CA.

 

Spectrum-Imaging Quantification of Minor Constituents (Invited). J. A. Hunt, Gatan Research & Development, Pleasanton, CA.

 

A Comparative Study of Interfacial Microstructure, Phase Stability and Film Morphology for Ohmic Contacts to p+-GaAs and Al0.26Ga0.74As. M. W. Cole, W. Y. Han, L. M. Casas, D. W. Eckart, T. Monahan, and K. A. Jones, Army Research Laboratory, Ft. Monmouth, NJ.

 

The Self-Supporting Disc: A Specimen Geometry Exhibiting Low Secondary Characteristic Fluorescence. I. M. Anderson, C. B. Carter and J. Bentley, Metals & Ceramics Div., Oak Ridge National Laboratory, Oak Ridge, TN and Dept. of Materials Science, University of Minnesota, Minneapolis, MN.

     
       

       

 

Determination of the Volume Fraction of Precipitates from Thin Foils in TEM, Image Analysis and Mathematical Morphology. G. L'Espérance, S. Tremblay, S. Laroche and C. Forget, Centre for Characterization and Microscopy of Materials, Ecole Polytechnique de Montréal, Québec, Canada.

 

Grain Growth in Vacuum-Deposited NiFe Thin Films during Annealing and the Effect of Grain Size. P. B. Narajan, RMMI / Quantum Corp., Louisville, CO.

 

Tuesday, August 8, AM

Detection and Analysis of Soft X-Rays

Chairs: G. Rémond, BRGM, Orléans, France

D. E. Newbury, NIST, Gaithersburg, MD

Contribution of Beam-Induced States to the O Ka Peak of Alumina : Consequences for Electron Probe Microanalysis (Invited). M. Fialin, C. Bonnelle, G. Rémond and P. Blanc, Université Pierre et Marie Curie, Paris, and BRGM, Orléans, France.

 

Enhancement of Soft X-Ray Spectrometer Performance by Using Optimized X-Ray Multilayer Mirrors (Invited). J. Susini and E. Ziegler, European Synchroton Radiation Facility, Grenoble, and J. M. Andre, R. Barchewitz, A. Sammar and K. Krastev, Université Paris 6, France.

 

Radiation Effects in the Microbeam Analysis of Insulating Materials (Invited). Jacques Cazaux, Université de Reims Champagne-Ardenne, U.F.R. Sciences, Reims, France.

 

The Quantitative Mapping of Protein and Calcium in Mineralised Tissues by Scanning X-Ray Microscopy. C. J. Buckley, N. Khaleque, S. J. Bellamy, M. W. Robins and X. Zhang, Dept. of Physics, King's College, London, U.K. and Dept. of Physics, State University of New York, Stony Brook, NY.

 

The Effect of Digital Pulse Shaping on Soft X-Ray Resolution. J. J. Friel and R. B. Mott, Princeton Gamma-Tech, Princeton, NJ.

 

Energy Dispersive Spectrometry of Low-Energy X-Rays. (Invited). P. Statham, Microanalysis Group, Oxford Instruments Ltd., High Wycombe, Bucks, England, U.K.

 

Wavelength Dispersive Spectra in the Soft X-Ray Energy Region. G. Rémond, C. Gilles, M. Fialin, O. Rouer, R. Marinenko, R. Myklebust and D. Newbury, Département Géomateriaux et Géoprocédés, BRGM, Orléans, France and Nat'l Institute of Standards and Technology, Gaithersburg, MD.

 

Analysis from X-Ray Emission Bands (Invited). C. Bonnelle, Laboratoire de Chimie Physique Matière et Rayonnement, Université Pierre et Marie Curie, Paris, France.

 

Problems and Opportunities in the Use of L-Lines of the First-Row Transition Elements in Quantitative Electron Microbeam Analysis (Invited). J. T. Armstrong, Div. of Gelogical and Planetary Science, California Institute of Technology, Pasadena, CA.

 

Tuesday, August 8, AM and PM

Infrared and Raman Microanalysis

Chairs: J. M. Chalmers, ICI / plc, Wilton Research Centre, England, U.K.

D. J. Gardiner, University of Northumbria at Newcastle, England, U.K.

Confocal Raman Imaging of Industrial Polymers (Invited). L. Markwort and Bert Kip, DSM Research, Geleen, The Netherlands.

 

Line Focus Raman Imaging (Invited). D. J. Gardiner, M. Bowden and S. R. Sails, Dept. of Chemical and Life Sciences, University of Northumbria at Newcastle, Newcastle upon Tyne, England, U.K.

 

Applications of a Novel Infrared Interferometric Technique for Rapidly Performing Simultaneous Chemical State Imaging and Spectroscopy (Invited). E. Neil Lewis, Laboratory of Chemical Physics, National Institutes of Health, Bethesda, MD.

 

In Situ Diffusion and Miscibility Studies of PDLC Systems by Infrared Microspectroscopy (Invited). S. R. Challa, S. Q. Wang and J. L. Koenig, Dept. of Macromolecular Science, Case Western Reserve University, Cleveland, OH.

 

Micro-Raman Spectroscopic Techniques for the Characterization and Process Control of Photonic Device Microchemistry (Invited). D. D. Tuschel, Kodak Research Laboratories, Eastman Kodak Company, Rochester, NY.

 

Immersion Raman Microspectroscopy (Invited). A. J. Sommer, Molecular Microspectroscopy Laboratory, Miami University, Oxford, OH.

 

Interrogating the Morphology of Poly(Ethylene) Tubing/Sheathing by Vibrational Spectroscopy-Microscopy Techniques (Invited). J. M. Chalmers, N. J. Everall and A. Local, ICI plc, Wilton Research Centre, Cleveland, England, U.K.

 

Integration of Chemometrics Techniques in Data Reduction of Raman Microprobe Spectra: Spin-Oriented Fibers of Polyethylene Terephthalate as an Example (Invited). Fran Adar and Herman Noether, Instruments SA / Spex Industries, Edison, NJ.

 

Fiber-Optic-Coupled Raman Microscope for Near-Line Process Control. K. L. Davis and J. B. Slater, Kaiser Optical Systems, Inc., Ann Arbor, MI.

     
       

       

 

The Advantages of Synchrotron Radiation for Infrared Microspectroscopy (Invited). J. A. Reffner, G. L. Carr and G. P. Williams, Spectra-Tech, Inc., Shelton, CT, Northrop Grumman Corp., Bethpage, NY and NSLS at Brookhaven National Lab., Upton, NY.

 

Infrared Microspectroscopy and Computer Library Searching . K. Smith, McCrone Associates Inc., Westmont, IL.

 

Raman Imaging Microscopy using Global and Point Illumination (Invited). D. N. Batchelder, K. J. Baldwin, C. Cheng, I. P. Hayward, D. M. Hunter, T. E. Kirkbride, H. S. Sands, R. J. Lacey and G. D. Pitt, Dept. of Physics, University of Leeds and Renishaw plc, Glocestershire, England, U.K.

 

Phase Identification of Yttria-Stabilized Zirconia Powders and Coatings by Near-Infrared Excited FT Raman Microspectroscopy. E. S. Etz and E. B. Steel, Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD.

 

Characterization and Application of a Grazing Angle Objective for Quantitative Infrared Reflection Microspectroscopy. S. V. Pepper, Lewis Research Center, National Aeronautics and Space Administration, Cleveland, OH.

 

Tuesday, August 8, AM and PM

Micro- XRD/XRF / Chemical State

Chair: D. A. Carpenter, Oak Ridge Centers for Defense and Manufacturing Technology, Oak Ridge, TN

X-Ray Optics of Tapered Capillaries: Theory and Experiment (Invited). D. X. Balaic, Z. Barnea, K. A. Nugent, S. W. Wilkins, H. Yamada, S. Masui and R. Garrett, University of Melbourne, Parkville, Victoria, Australia.

 

Tapered Multicapillary Optics for X-Ray Focusing (Invited). Qi-Fan Xiao and Ning Gao, X-Ray Optical Systems, Inc. Albany, NY.

 

X-Ray Excited Luminescence as a Materials Characterization Technique (Invited). D. B. Wittry, Department of Materials Science and Engineering, University of Southern California, Los Angeles, CA.

 

Applications of Synchrotron X-Ray Beams (Invited). K. W. Jones, Department of Applied Science, Brookhaven National Laboratory, Upton, NY.

 

Chemical State Imaging by X-Ray Spectroscopy - Present and Future Dream. (Invited). Y. Gohshi, Faculty of Engineering, The University of Tokyo, Tokyo, Japan.

 

A Laboratory µ-XRF Spectrometer Employing Capillary Optics (Invited). K. Janssens, B. Vekemans, A. Rindby, L. Vincze and F. Adams, Department of Chemistry, University of Antwerp (U.I.A.), Antwerp, Belgium.

 

Fabrication and Development of Tapered Capillary X-Ray Optics for Microbeam Analysis (Invited). B. R. York, Materials Laboratory, IBM Corporation, San Jose, CA.

 

Quantitative Analysis of Individual Particles by X-Ray Microfluorescence Spectrometry (Invited). M. Lankosz, Faculty of Physics, University of Mining and Metallurgy, Krakow, Poland and P. A. Pella, National Institute of Standards and Technology, Gaithersburg, MD.

 

Microanalysis of PEM Fuel Cell Membrane-Electrode Assemblies by XRMF, SEM and EDS. G. J. Havrilla and R. L. Borup, Los Alamos National Laboratory, Los Alamos, NM.

 

Quantitative µ-XRF Analysis of Heterogeneous Samples. L. Vincze, K. Janssens and K. Jones, Department of Chemistry, University of Antwerp, Antwerp, Belgium and Dept. of Applied Science, Brookhaven National Laboratory, Upton, NY.

 

Simultaneous X-Ray Microfluorescence and Microdiffraction Analysis using Total Reflection Glass Capillaries. R. Tissot, D. Boehme and G. Havrilla, Materials and Process Sciences Center, Sandia National Laboratories, Albuquerque, NM.

 

Parameters Influencing Focusing Capabilities of Capillary Optics. L. Vincze, K. Janssens, F. Adams, S. Larsson, A. Rindby and P. Engström, Department of Chemistry, University of Antwerp (U.I.A.), Antwerp, Belgium.

 

X-Ray Fluorescence Intensities from Thin Specimens for Convergent Beams. S. Seshadry and D. B. Wittry, Department of Materials Science and Engineering, University of Southern California, Los Angeles, CA.

 

Comparison of Singly-Curved X-Ray Diffractors for Use in X-Ray Fluorescence Analysis. R. Y. Li and D. B. Wittry, Department of Materials Science and Engineering, University of Southern California, Los Angeles, CA.

 

Tuesday, August 8, PM

Biological Analytical Electron Microscopy - Part 1: X-Rays

Chair: S. B. Andrews

Interactive Elemental Image Acquisition and Processing (Invited). D. A. Kopf, A. LeFurgey and P. Ingram, Medical Center, Duke University, Durham, NC and Research Triangle Institute, Research Triangle Park, NC.

       

       

 

Low Voltage, Low Temperature, High Resolution Digital Scanning Electron Microscopy and X-Ray Microanalysis (Invited). P. Echlin, School of Biological Sciences, University of Cambridge, Cambridge, England, U.K.

 

Cryo-Operation Minimizes Contamination and Electron Beam Damage in the Low-Voltage High-Resolution Field Emission SEM. R. R. Warner and D. S. Jacobs, Miami Valley Labs, Procter & Gamble Co., Cincinnati, OH.

 

X-Ray Imaging of Bone Marrow Cells and Subcellular Organelles Exposed to Cisplatin. R. G. Kirk, M. Gates and P. Lee, Depts of Anatomy and Physiology, Health Sciences Center, West Virginia University, Morgantown, WV.

 

Barnacle Shells Analyzed by X-Ray Imaging can Provide a Chronological Record of Metal Contamination in Estuaries. D. Hockett, P. Ingram, D. Kopf and Ann LeFurgey, School of the Environment and Medical Center, Duke University, Durham, NC.

 

Tuesday, August 8, PM and Wednesday, August 9, AM

Quantitative X-Ray Microanalysis

Chairs: C. Nockolds, The University of Sydney, Sydney, Australia

P. Carpenter, California Institute of Technology, Pasadena, CA

A New Quantitative Procedure for Stratified Samples in EPMA (Invited). C. Merlet, CNRS, Université de Montpellier II, Montpellier, France.

 

EPMA Sputter Depth Profiling: A New Technique for Quantitative In-Depth Analysis of Layered Structures (Invited). P. Karduck and A. von Richthofen, Gemeinschaftslabor für Elektronenmikroskopie and Lehrstuhl für Theoretische Hüttenkunde, RWTH Aachen, Aachen, Germany.

 

Comparison of Simplex and Multiple Linear Regression Peak Fitting using Generated Spectra (Invited). C. R. Swyt, National Institutes of Health, Bethesda, MD.

 

An Improved Mean Atomic Number Background Correction for Quantitative Microanalysis. J. J. Donovan and T. N. Tingle, University of California-Berkeley and Stanford University, Stanford, CA.

 

Quantitative Microanalysis of Minerals - A Case Study using Love and Scott and Papp Approaches. R. Natarajan, National Geophysical Research Institute, Hyderabad, India.

 

Practical Considerations for Performing "State-of-the-Art" Quantitative Analysis with the SEM (Invited). J. T. Armstrong, Div. of Geological and Planetary Science, California Institute of Technolgy, Pasadena, CA.

 

The Secondary Characteristic Fluorescence Correction in EPMA. I. M. Anderson, C. B. Carter and J. Bentley, Metals & Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN and Dept. of Materials Science, University of Minnesota, Minneapolis, MN.

 

Analysis of Backscattered Electron Signals from Microstructures of Steps and Holes. K. Murata, Y. Irisawa, M. Yasuda and H. Kawata, Department of Physics and Electronics, University of Osaka Prefecture, Osaka, Japan.

 

X-Ray Coincidence in Atmospheric Thin-Window and Windowless Si-Li X-Ray Detectors. J. A. Small and D. E. Newbury, National Institute of Standards and Technology, Gaithersburg, MD.

 

A Look at the Relative Peak Intensities of the L X-Ray Lines of Gold. R. L. Myklebust and R. B. Marinenko, National Institute of Standards and Technology, Gaithersburg, MD.

 

X-Ray Analysis with the Help of a Monte Carlo Program. P. Hovington, R. Gauvin, D. Drouin and D. C. Joy, Université de Sherbrooke, Québec, Canada, and University of Tennessee, Knoxville, TN.

 

Certification of K-411 Glass Microspheres with Electron Probe Microanalysis. S. Roberson, R. B. Marinenko, J. S. Small, D. Blackburn, D. Kauffman and S. Leigh, Dept. of Chemistry, Georgetown University, Washington, DC and NIST, Gaithersburg, MD.

 

dQuant: A Windows-Based Quantitative Analysis Program for Electron Probe Microanalyzers. C. R. Herrington and J. D. Geller, Geller MicroAnalytical Laboratory, 426E Boston Street, Topsfield, MA 01983-1200.

 

Wednesday, August 9, AM

Biological Analytical Electron Microscopy - Part 2: EELS

Chair: A. LeFurgey, Duke University - Medical Center, Durham, NC

Energy Filtered Imaging of Nucleoprotein Complexes In Vitro and In Situ (Invited). M. J. Hendzel and D. P. Bazett-Jones, Depts of Anatomy and Medical Biochemistry, University of Calgary, Calgary, Alberta, Canada.

 

Low-Dose Energy Filtering in Biology (Invited). S. B. Andrews, P. E. Gallant, S. Q. Sun, and R. D. Leapman, National Institutes of Health, Bethesda, MD.

 

Improved Method for Quantifying EELS Difference Spectra from Biological Specimens. R. D. Leapman and S. B. Andrews, National Institutes of Health, Bethesda, MD.

 

Electron Energy Loss Spectra from Biological Componds. S. Q. Sun, S. L. Shi and R. D. Leapman, National Institutes of Health, Bethesda, MD.

       

       

 

Measurement of Ion Concentrations in Very Dilute Cellular Compartment by Analytical Electron Microscopy. S. L. Shi, S. Q. Sun, B. Bowers and R. D. Leapman, National Institutes of Health, Bethesda, MD.

 

Wednesday, August 9, AM

Sample Preparation for Microanalysis

Chair: P. A. Martoglio, Spectra -Tech, Inc., Shelton, CT

Chemical Ion Milling of Materials. (Invited). Reza Alani, Gatan Research & Development, Pleasanton, CA.

 

Sample Preparation Techniques for the Analysis of Colorants by Visible Microspectrophotometry (Invited). M. Derrick and C. Sloper, Getty Conservation Institute, Marina del Ray, CA.

 

Cross-Section TEM Specimen Preparation of Friable Catalyst Materials to Preserve Spatial Integrity (Invited). K. L. More, D. W. Coffey and T. S. Geer, Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN.

 

Specific Site Device Failure Analysis: TEM Specimen Preparation (Invited), R. Anderson, S. Klepeis, W. Fox, S. Hawks, M. Hudson and J. Benedict, IBM Corp., East Fishkill, NY.

 

Sample Preparation for Infrared Microspectroscopy: An Industrial Perspective (Invited). P. T. McKittrick, Morton International, Inc., Woodstock, IL.

 

X-Ray Microscopy of Polymeric Materials and Sample Preparation Issues. (Invited). H. Ade, A. P. Smith, B. Wood, I. Plotzker, B. Hsiao and S. Subramoney, Dept. of Physics, North Carolina State University, Raleigh, NC and Experimental Station, DuPont, Wilmington, DE.

 

Sample Preparation ? in Raman Microspectroscopy (Invited). A. J. Sommer, Molecular Microspectroscopy Laboratory, Miami University, Oxford, OH.

 

Sample-Preparation Techniques for Infrared Microspectroscopy (Invited). J. A. Reffner and P. A. Martoglio, Spectra-Tech, Inc., Shelton, CT.

 

Improved Sample Preparation Procedures for Analytical Studies of Polycrystalline CdTe Thin Films. K. M. Jones, M. M. Al-Jassim, H. R. Moutihno, R. Dhere and P. Sheldon, National Renewable Energy Laboratory, Golden, CO.

 

Wednesday, August 9, AM

Microanalysis for Nanotechnology

Chairs: H. W. Hahn, Technical University Darmstadt, Darmstadt, Germany

G. G. Hembree, Arizona State University, Tempe, AZ

   

Structure Analysis of Nanocrystalline ZrO2. R. Nitsche, M. Winterer, M. Rodewald and H. Hahn, Materials Science Department, Technical University Darmstadt, Darmstadt, Germany.

 

Analysis of Nanometer Sized Pyrogenic Particles by Scanning Transmission Electron Microscopy. D. J. Wallis, N. D. Browning and C. M. Megaridis, Dept. of Physics, and Dept. of Mech. Engineering, University of Illinois at Chicago.

 

The Analysis of Nanoscale Particles by Analytical Electron Microscopy (Invited). D. E. Newbury and R. D. Leapman, NIST, Gaithersburg, MD and NIH, Bethesda, MD.

 

Characterization of Nanostructured Materials using Surface-Sensitive Techniques (Invited). G. B. Hoflund, Department of Chemical Engineering, University of Florida, Gainesville, FL.

 

IMicrostructural Characterization of Electrodeposited Nanocrystalline Ni- 1.2 wt% P Alloy. D. A. Smith, S. C. Mehta and U. Erb, Dept. of Materials Science and Engineering, Stevens Institute of Technology, Hoboken, NJ and Dept. of Materials Science, Queens' University, Kingston, Ontario, Canada.

 

Characterization of Carbon Encapsulated Nanocrystals using Electron Energy-Loss Spectrometry. D. C. Winkler and S. Majetich, Surface and Microanalysis Science Division, NIST, Gaithersburg, MD and Physics Department, Carnegie Mellon University, Pittsburgh, PA.

 

Nanometer-Resolution Auger Electron Microscopy (Invited). Jingyue Liu, Center for Solid State Science, Arizona State University, Tempe, AZ.

 

High Spatial Resolution X-Ray Photoelectron Microscopy and Spectroscopy (Invited). J. Denlinger, E. Rotenberg, D. Dunham, T. Warwick, S. D. Kevin and B. P. Tonner, Dept. of Physics, University of Wisconsin, Milwaukee, WI, Dept. of Physics, Univ. of Oregon, Eugene, OR and Advanced Light Source, Lawrence Berkeley Lab, Berkeley, CA.

 

Thursday, August 10, AM

Analytical Electron Microscopy - Part 3: EELS of Interfaces

Chair: M. M. Disko, Exxon Research & Engineering, Annandale, NJ

Spatially Resolved EELS on Interfaces and Nanostructures (Invited). C. Colliex, Lab. de Physique des Solides, Université Paris-Sud, Orsay, France.

 

Electron Energy-Loss Fine Structure Studies of Interfaces (Invited). J. Bruley, D. B. Williams and V. Keast, Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA.

       

       

 

Characterization of Nanometer-Sized Precipitates and Grain Boundaries by Electron Spectroscopic Imaging (Invited). F. Hofer and P. Warbichler, Research Institute for Electron Microscopy, Technical University of Graz, Graz, Austria.

 

Measuring Bonding Changes at an Interface: A Case Study in Ni3Al. D. A. Muller, S. Subramanian, S. L. Sass, J. Silcox and P. E. Batson, Cornell University, Ithaca, NY and IBM Thomas J. Watson Research Center, Yorktown Heights, NY.

 

Investigation of Grain Boundary Segregation in Acceptor and Donor Doped Strontium Titanate. V. Ravikumar, R. P. Rodrigues, N. Wilcox, and V. P. Dravid, Northwestern University, Evanston, IL.

 

Thursday, August 10, AM

The New Moon After Apollo

Chair: W. I. Ridley, U.S. Geological Survey - Denver, Denver, CO

 

Thursday, August 10, AM

Environmental Scanning Electron Microscopy

Chair: K.-R. Peters, University of Connecticut Health Center, Farmington, CT

Detection and Imaging in Environmental SEM Hydration-Induced Contrast Phenomena (Invited). P. Meredith and A. M. Donald, Cavendish Laboratory, University of Cambridge Department of Physics, Cambridge, England, U.K.

 

A Review of Qualitative and Quantitative EDS X-Ray Microanalysis of Hydrated and Non-Hydrated Samples, and Associated Imaging Strategies (Invited). B. J. Griffin, A. van Riessen and L. Egerton Warburton, Centre for Microscopy and Microanalysis, University of Western Australia, Australia.

 

Experimental Optimization of Contrast for the Investigation of Joint Non-Conducting Materials in the ESEM (Invited). H. Schnarr and M. Füting, Fraunhofer Institute of Mechanics of Materials, Halle, Germany.

 

Contrast Mechanisms in the ESEM Analyzed and Enriched by Differential Hysteresis Image Processing (Invited). K. - R. Peters, Biomolecular Structure Analysis Center, University of Connecticut Health Center, Farmington, CT.

 

Imaging Ceramics in the Environmental Scanning Electron Microscope. S. McKernan, Center for Interfacial Engineering Microscopy, University of Minnesota, Minneapolis, MN.

   

An Approach to Improve Low Magnification Imaging in the Environmental Scanning Electron Microscope. S. A. Wight and M. E. Taylor, Surface and Microanalysis Science Division, NIST, Gaithersburg, MD and Materials and Nuclear Engineering, University of Maryland, College Park, MD.

 

Thursday, August 10, PM

Analytical Electron Microscopy - Part 4: EELS Theory and Applications

Chair: N. Zaluzec, Argonne National Laboratory, Argonne, IL

Calculation of Near Edge Structure (Invited). P. Rez and J. Bruley, Arizona State University, Tempe, AZ and Lehigh University, Bethlehem, PA.

 

A Study of EELS Fine Structure in Three Chromium Carbides . G. Hug, R. Leapman and M. Jaouen, LEM, ONERA-CNRS, Châtillon, France, NIH, Bethesda, MD and Université de Poitiers, France.

 

Improved PEELS Performance with an Imaging Filter. O. L. Krivanek, M. K. Kundmann, C. Trevor and R. D. Leapman, Gatan Research and Development, Pleasanton, CA and National Institutes of Health, Bethesda, MD.

 

Detection of Hydrogen in Irradiated, Frozen Hydrated Organic Materials by EELS. R. D. Leapman and S. Q. Sun, National Institutes of Health, Bethesda, MD.

 

A Background Subtraction Routine for Enhancing Energy-Filtered Plasmon Images of MgAl2O4 Implanted with Al+ and Mg+ Ions . N. D. Evans, E. A. Kenik, J. Bentley and S. J. Zinkle, Oak Ridge Institute for Science and Education and Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN.

 

An Approach for Experimental Determination of Stopping Power at Low Energies by EELS. S. Luo, D. C. Joy, N. Evans and J. R. Dunlap, EM Facility, University of Tennessee, Knoxville, TN and Oak Ridge National Laboratory, Oak Ridge, TN.

 

Disposition of Plutonium and Cerium in Waste Forms Determined by Electron Energy Loss Spectroscopy. J. A. Fortner, E. C. Buck and J. K. Bates, Chemical Technology Division, Argonne National Laboratory, Argonne, IL.

 

Thursday, August 10, PM

Computational Methods in Microscopy

Chairs: M. T. Postek and D. E. Newbury, NIST, Gaithersburg, MD

Simulations of SEM Images of Rough Surfaces by Monte Carlo (Invited). R. Gauvin, P. Hovington, D. Drouin and D. C. Joy, Département de Génie Mécanique, Université de Sherbrooke, Sherbrooke, Québec, Canada and EM Facility, University of Tennessee, Knoxville, TN.

     
       

       

 

Electron Stopping Powers A Progress Report. D. Joy, S. Luo, R. Gauvin, P. Hovington, and N. Evans, EM Facility, University of Tennessee, Knoxville, TN and Département de Génie Mécanique, Université de Sherbrooke, Sherbrooke, Québec, Canada.

 

A Quasi 3-Dimensional Monte Carlo Simulator Using a Modified Quadtree Geometry Discretization. C. O. Schiebl, H. Wagner, and A. Pfeiffer, Campusbased Engineering Center, Digital Equipment Österreich AG, Wien, Austria.

 

Monte Carlo Studies of Effects of Fast Secondary Electrons on Backscattered and Secondary Edges Images. D. Drouin, P. Hovington, and R. Gauvin, Universitè de Sherbrooke, Quèbec, Canada.

 

The Influence of Film Composition on X-Ray Generation in Film/Substrate Systems. L. A. Bakaleinikov and V. V. Tretyakov, A. F. Ioffe Physical-Technical Institute, St.- Petersburg, Russia.

 

Monte Carlo Calculations of Backscattering Coefficients and Ka X-Ray Productions in Al and Si Targets by 10 - 40 keV Electrons. H. Konuma, K. Kuroki and N. Saitoh, National Research Institute of Police Science, Tokyo, Japan.

 

The Calculation of X-Ray Signals using Monte Carlo Methods. D. G. Howitt, T. D. Ly and M. K. Farrens, Department of Chemical Engineering and Materials Science, University of California, Davis, CA.

 

Thursday, August 10, PM

Advances in Scanning Electron Microscopy

Chair: M. Kotera, Osaka Institute of Technology, Osaka, Japan

Low KV X-Ray Mapping in a FESEM (Invited). C. Nockolds, Electron Microscopy Unit, University of Sydney, Sydney, Australia.

 

Simulation of the Type-I Magnetic Contrast in the Scanning Electron Microscope (Invited). M. Kotera, M. Katoh and H. Suga, Dept. of Electronic Engineering, Osaka Institute of Technology, Osaka, Japan.

 

Direct Measurements of the Strains in Polycrystalline Diamond Films using Electron Channelling. S. J. Chen, D. G. Howitt, A. B. Harker and J. F. Flintoff, Dept. of Chem. Engineering and Materials Science, University of California, Davis, CA and Rockwell International Science Center, Thousand Oaks, CA.

 

An Estimation of Errors Resulting from Stereological Measurements of Inclusions Characterized by X-Ray Mapping in SEM. C. Blais, G. L'Espérance, É. Baril and C. Forget, École Polytechnique de Montréal, Québec, Canada.

   

Quantitative SEM/EDS Analysis of High-Level Waste Glasses. J. S. Luo, S. Wolf, W. Ebert and J. K. Bates, Chemical Technology Div., Argonne National Laboratory, Argonne, IL.

 

Thursday, August 10, PM

Chemometric Techniques for Spectral Analysis

Chair: S. V. Medlin, U.S. Army Research Lab, Aberdeen, MD

Numerical Methods for TOF-SIMS Analysis (Invited). S. MacKay and R. Pranis, Corporate Research Laboratories, 3M Center, St. Paul, MN.

 

Simple-to-Use Interactive Self-Modeling Mixture Analysis of FT-IR Microscopy Data (Invited). W. Windig, S. Markel, Eastman Kodak Co., Rochester, NY and J. Guilment, Kodak European Research Labs, Chalon/Saône Cedex, France.

 

Investigation of Interfacial Segregation in Steels using Multivariate Analysis of EDXSpectra. J. M. Titchmarsh, S. Dumbill and I. A. Vatter, Sheffield Hallam University and AEA Technology, Harwell Laboratory, England, U.K.

 

Interpretation of Vibrational Spectra using Artificial Neural Networks,. S. Medlin, J. Morris and R. Fifer, U.S. Army Research Labs, Aberdeen Proving Ground, MD.

 

Applications of Factor Analysis and Artificial Neural Network in Electron Spectroscopic Depth Profiling. H. Bubert and T. Niebuhr, Institut für Spektrochemie und Angewandte Spektroskopie, Dortmund, Germany.

 

Use of Target Factor Analysis to Decompose Electron Energy Loss Spectrum-Line Profiles. S. J. Splinter, J. Bruley and D. A. Smith, Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA.

 

Quantitative Surface Analysis using Image Interpretation with Scatter Diagrams and Principal Components Analysis. I. R. Barkshire, P. G. Kenny and M. Prutton, University of York and University of Bradford, England, U.K.

 

Friday, August 11, AM

Microprobe Applications in Materials Science

Chair: D. Kruger, IBM Corporation, Hopewell Junction, NY

Microprobe Analysis Applications in Microelectronics. D. Kruger, Microelectronics Division, IBM Corp., Hopewell Junction, NY.

 

Evaluation of Special-Purpose Diffracting Crystals for Use in WDX Microanalysis . R. Rybka, R. C. Wolf and R. B. Wolf, Microspec Corporation, Fremont, CA.

     
       

       

 

X-Ray Microanalysis on Fe-Rich Fe-Ni-S System at 9000C - 3000C. Lina Ma, D. B. Williams, and J. I. Goldstein, Lehigh University, Bethlehem, PA and University of Massachusetts, Amherst, MA.

 

Platinum Distribution in Large Single Crystals of YBa2Cu3O7-x. E. P. Vicenzi, J. S. Lettow, D. L. Milius and I. Aksay, Princeton Materials Institute, Princeton University, Princeton, NJ.

 

Energy Dispersive Electron Microprobe Analysis of Bismuth and Lead in BSCCO High-Tc Superconductors using a Multiple Linear Least Squares Data Reduction Procedure. R. B.Marinenko, National Institute of Standards and Technology, Gaithersburg, MD.

 

Grain Growth Kinetics in Ordered CoPt Thin Films. R. A. Ristau, K. Barmak, D. W. Hess, K. R. Coffey and J. K. Howard, Dept. of Materials Science and Engineering, Lehigh University, Bethlehem, PA and IBM Storage Systems Division, San Jose, CA.

 

A Study of Reactive Phase Formation in Sputter Deposited Nb-Al Multilayer Thin Films. V. Saikumar, K. Barmak and C. Michaelsen, Dept. of Materials Science and Engineering, Lehigh University, Bethlehem, PA and GKSS Research Center, Geesthacht, Germany.

 

Friday, August 11, AM

Micro-Analytical Applications in the Geosciences

Chairs: W. I. Ridley and G. P. Meeker, U. S. Geological Survey - Denver, Denver, CO

Laser Microprobe Stable Isotopic Studies of Sulfide, Silicate and Carbonate Minerals: A Progress Report (Invited). W. C. ("Pat") Shanks, U.S. Geological Survey, Denver, CO.

 

Laser Ablation Inductively Coupled Plasma MassSpectrometer (a Micro-Macro Analytical Tool) (Invited). F. E. Lichte, U.S. Geological Survey, Denver, CO.

 

Magma Mingling and Xenolith Entrainment "Caught in the Act" during the 1991-92 Eruptions of Pinatubo Volcano: Evidence from Digital Wavelength Dispersive X-Ray Images. J. S. Pallister and G. P. Meeker, U.S. Geological Survey, Denver, CO.

 

Large-Scale Chemical Mapping of Refractory Inclusions from the Allende Meteorite: A Clue to Variations of Ambient Conditions in the Solar Nebula. G. P. Meeker, U.S. Geological Survey, Denver, CO.

 

Magmatic Processes at Spreading Centers as Reflected i the Mineral Chemistry of a Microgabbro from the East Pacific Rise. W. I. Ridley, M. R. Perfit and M. Smith, U.S. Gelogical Survey, Denver, CO.

 

The Preparation of a Relatively Large Quantity of a Homogeneous Basalt-Glass Microbeam Standard by the U.S. Geological Survey. J. E. Taggart, Jr., S. A. Wilson and P. J. Wolpert, U.S. Geological Survey, Denver.

 

Electron Microprobe Analysis of Oxygen in Geological Materials (Invited). M. N. Spilde and L. J. Crossey, Inst. of Meteoritics and Dept. of Earth and Planetary Sciences, University of New Mexico, Albuquerque, NM.

 

Friday, August 11, AM

New and Emerging Techniques

Chair: D. Golijanin, Fisons Instruments/Kevex, Valencia, CA

Recent Developments in Curved Diffractors for Focussing X-Rays (Invited). D. B. Wittry, Department of Materials Science and Engineering, University of Southern California, Los Angeles, CA.

 

Non Contact Voltage Measurement using UV Light (Invited). J. Patterson, Silicon Systems, Tustin, CA.

 

Wavelength Dispersive Spectrometer for JEOL 100CX TEM. Z. W. Chen and D. B. Wittry, Department of Materials Science and Engineering, University of Southern California, Los Angeles, CA.

 

X-Ray Microscope. X. Zhang, R. Balhorn, J. Kirz, and S. Williams, State University of New York, Stony Brook, NY and Lawrence Livermore National Lab, Livermore, CA.

 

X-Ray Point Focusing using Cylindrically Bent Crystals with Modulated Surfaces (Invited). W. Z. Chang and E. Förster, X-Ray Optics Group, Max-Planck Gesellschaft at the Friedrich Schiller University, Jena, Germany.

 

The Role of Acoustic Microscopy in the Development of Surface Mount IC Packaging (Invited). T. M. Moore, Central Research Labs, Texas Instruments, Inc., Dallas, TX.

 

Scanning Acoustic Imaging of Residual Stress in Solids (Invited). E. Drescher-Krasicka, Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD.

 

Nondestructive Acoustic Inspection for Long-term Reliability Studies of Power IC's (Invited). K. M. Baker, Ford Microelectronics, Colorado Springs, CO.

 

The Role of Acoustic Microscopy in the Development of Surface Mount IC Packaging (Invited). T. M. Moore, Central Research Labs, Texas Instruments, Inc., Dallas, TX.

     
       

       

 

Friday, August 11, AM

Image Processing and Multivariate Image Analysis in Microscopy

Chairs: D. B. Bright, NIST, Gaithersburg, MD

P. Geladi, Umea University, Umeå, Sweden

An Overview of Multivariate Image Analysis (Invited). P. Geladi, Research Group for Chemometrics, University of Umeå, Sweden.

 

Application of Multivariate Techniques in Image Analysis (Invited). P. Van Espen, Department of Chemistry, University of Antwerpen (UIA), Antwerpen, Belgium.

 

Automatic Handling of Multivariate Maps in Microanalysis (Invited). N. Bonnet, M. Herbin and P. Vautrot, INSERM Unit, University of Reims, Reims, France.

 

Measurement of Chemical Components Using Scatter Diagrams with Principal Component Analysis . D. S. Bright, Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD.

 

Additional Information

For additional information, including a meeting bulletin, please contact:

LAC Chair:

Gregory Meeker

United States Geological Survey

P.O. Box 25046, MS 903

Denver Federal Center

Denver, CO 80225

(303) 236-1081 - Tele.

(303) 236-1414 - FAX

e-mail: gmeeker@usgsprobe.cr.usgs.gov

Technical Program Chair:

Edgar S. Etz

Bldg. 222/A113

National Institute of Standards & Technology

Gaithersburg, MD 20899

(301) 975-3909 - Tele.

(301) 216-1134 - FAX

e-mail: etz@gapnet.nist.gov

   

University of Texas at Dallas

Box 830688

Richardson, TX 75083-0688

(214) 883-2706; 2925 FAX

email: imusselm@utdallas.edu

 

MEMBERSHIP INFORMATION

MAS Membership Services INFO

Scott Wight

P.O. Box 3552

Gaithersburg, MD 20885

Phone: 1-800-4MASMEM

 

SUSTAINING MEMBERS

Our Sustaining Members Contribute Substantial Support to MAS

4pi Analysis, Inc.

Advanced MicroBeam, Inc.

Amray, Inc.

Cameca Instruments, Inc.

Charles Evans & Associates

Dapple Systems

Denton Vacuum, Inc.

Electron Microscopy Sciences / Diatome US

ETP-USA / Electron Detectors, Inc.

FEI Company

Fisons Instruments

Gatan, Inc.

Geller MicroAnalytical Laboratory

Hessler Technical Services

HNU X-ray Systems, Inc.

JEOL USA, Inc.

R.J. Lee Group, Inc.

Lehigh University

Leica, Inc.

Materials Analytical Services, Inc.

McCrone Associates, Inc.

Micron, Inc.

Microspec Corporation

Nissei Sangyo America, Ltd.

Hitachi Scientific Instruments

NORAN Instruments, Inc.

Osmic, Inc.

Oxford Instruments, Inc.

Park Scientific Instruments

Physical Electronics Inc.

Philips Electronic Instruments

Princeton Gamma-Tech

SEM / TEC Laboratories, Inc.

Soft-Imaging Software Corporation

Spectra-Tech / Nicolet

SPI Supplies / Structure Probe, Inc.

C. M. Taylor Co.

Topcon Technologies, Inc.

Topometrix Corporation

Carl Zeiss, Inc.

     

EDITOR'S NOTE

Due to the length of the final program for the MAS 1995 meeting, the following features have been omitted or shortened for this issue: Lists of MAS Executive Council, Directors, Additional MAS Representatives, Affiliated Regional Societies and Sustaining Members; "What is the Microbeam Analysis Society?; Membership Application. Please consult the March/April 1995 issue of MicroNews for a complete listing.

 

Inga Holl Musselman, MicroNews Editor

Chemistry Program, BE26

 
       
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