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MicroNews May/Jun 1993

 

 

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May/June 1993

 

PRESIDENT'S MESSAGE

 

Dear Colleagues:

 

As has been said by all of the past presidents I can remember, it is indeed a very special privilege to single out members of our Microbeam Analysis Society to receive the Presidential Awards. These awards were reviewed and approved by our council at the Winter Council Meeting in January. It is my great pleasure to present to you here the following award recipients for 1993.

 

The recipient of the 1993 Presidential Science Award is Dale E. Newbury, Group Leader of Microanalysis Research at NIST, Gaithersburg, Maryland. Dale's contribution to the field of science, as well as to MAS, speaks for itself. He served on our council as a director (1979-1981) and as our president in 1984. His many accomplishments include 5 books and 212 papers with 6 in progress. Dale modestly feels that he has made significant contributions in Monte Carlo electron trajectory simulations, quantitative compositional mapping, and nanoanalysis. Over the many years that I have known Dale, he has been available to help anyone regardless of the time consumed or how trivial the problem. I am certain that there are many long time members of our society who will be quite surprised to learn that Dale has not already received this recognition. It gives me great pleasure to present the 1993 Presidential Science Award to Dale.

 

The recipient of the 1993 Presidential Service Award is Harvey A. Freeman. Harvey has been our MAS treasurer since 1989. Previous to that he had the distinction of being Chairman of the Sustaining Members Committee for over 10 years. As most of you know, this is a very critical relationship as our sustaining members are the lifeline of our existence. Harvey has recently retired from Dow Corning and is now a permanent resident of Brewster, MA on Cape Cod where he will have endless hours to devote to our MAS financial matters. It will be a great pleasure to present Harvey with the 1993 Presidential Service Award.

 

The recipient of the 1993 Heinrich Award for outstanding contributions to the field of microanalysis by a person under the age of 40 is Phillip E. Russell. Phil is the director of the Analytical Instrumentation Facility and a professor in the Department of Materials Science and Engineering and the Precision Engineering Center at North Carolina

 

 

 

 

State University. In addition to being a director of MAS since 1991, Phil was the program chair of our 1989 meeting in Asheville, NC. He is currently President of the North Carolina Society of Electron Microscopy and Microbeam Analysis. In 1986, Phil received the President's Young Investigator Award from President Reagan. I have known Phil for over 10 years and respect him as an excellent and very dedicated teacher. I am indeed pleased to present this award to him.

 

I want to thank the entire 1993 Local Arrangements Committee for what I know is going to be an excellent meeting. I am looking forward to seeing all of you at Loyola Marymount University in July. I would also like to say, as I begin to see the end of my presidency on the horizon, how very much I appreciate the confidence you have placed in my ability to serve, as well as the support and cooperation of our council and committee members. We have a wonderful society which, of course, is made up of truly capable and interesting individuals and to be made the society's president, even for a short time, is a real humbling experience, especially for me. Thanks go to so many of you for your very special help and to all of you for your support. I wish that each and every one of you might have such a magnificent experience sometime in your career.

 

Thank you all once again for the opportunity to serve both you and our society.

 

Thomas G. Huber

President

 
     

1993 PRESIDENTIAL AWARDS

 

Science Award - Dale E. Newbury

Service Award - Harvey A. Freeman

Heinrich Award - Phillip E. Russell


       

MEETING CALENDAR

 

37TH INTERNATIONAL SYMPOSIUM ON ELECTRON, ION, AND PHOTON BEAMS

June 1-4, 1993

San Diego, CA

Contact: Dr. Fritz J. Hohn

IBM T.J. Watson Research Center

P.O. Box 218

Yorktown Heights, NY 10598

(914) 945-1608

(914) 945-2141 FAX

 

ATOMIC FORCE MICROSCOPY / SCANNING TUNNELING MICROSCOPY SYMPOSIUM

June 8-10, 1993

Natick, MA

Contact: Mona Bray

(508) 651-4705

(508) 651-5104 FAX

 

15TH SYMPOSIUM ON APPLIED SURFACE ANALYSIS

June 9-11, 1993

Cleveland, OH

Contact: Jeffrey Eldridge

NASA Lewis Research Center, M/S 23-2

21000 Brookpark Road

Cleveland, OH 44135

(216) 433-6074

(216) 433-5170 FAX

 

MAS MEETING

Microbeam Analysis Society

July 11-16, 1993

Marina del Rey / Los Angeles, CA

Contact: Jack Worrall

MAS 1993

P.O. Box 1014

Monrovia, CA 91017-1014

(213) 740-1990

 

MSA MEETING

Microscopy Society of America

August 1-6, 1993

Cincinnati, OH

Contact: MSA Meeting Office

P.O. Box MSA

Woods Hole, MA 02543

(800) 538-3672

(508) 548-9053 FAX

 

INTERNATIONAL CONFERENCE ON STM

August 9-13, 1993

Beijing, China

Contact: Chunli Bai

Inst. of Chem.

Chinese Academy of Sci.

Beijing 100080, China

86-1-2568158

86-1-2569564 FAX

 

5TH TOPICAL CONFERENCE ON

QUANTITATIVE SURFACE ANALYSIS

November 12-13, 1993

Clearwater Beach, FL

Contact: Cedric Powell

NIST, Chemistry B-248

Gaithersburg, MD 20899

(301)975-2534

(301)216-1134 FAX

 

AVS 4OTH NATIONAL SYMPOSIUM

November 15-19, 1993

Orlando, FL

Contact: AVS

335 E. 45th Street

New York, NY 10017

(212) 661-9404

 

MATERIALS RESEARCH SOCIETY

FALL MEETING

November 29 - December 3, 1993

Boston, MA

Contact: MRS

9800 McKnight Road

Pittsburgh, PA 15237

(412) 367-3003

(412) 367-4373 FAX

 

XIII INTERNATIONAL CONGRESS

ON ELECTRON MICROSCOPY

July 18-22, 1994

Paris, France

Contact: B. Jouffrey

SFME, 67

rue Maurice Gunsbourg

94205 Ivry sur Seine cedex

France

33-1-46702844

33-1-46708846 FAX

 

MAS / MSA 1994, New Orleans, LA

MAS 1995, Denver, CO

MAS / MSA 1996, Minneapolis, MN


 

Lifshin, E.

Microbeam analysis in the industrial research laboratory

General Electric Corporate R&D, Schenectady, NY

 

Romig, A.D., Jr.

Microbeam analysis capabilities in the DOE national laboratories: current status and future opportunities

Sandia Nat'l. Labs., Mater. & Process Sci., Albuquerque, NM

 

Williams, D.B.

IFMAS: an organization whose time has come?

Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA

 

Armstrong, J.T.

Microbeam analysis of heavenly bodies

Caltech, Geol. Dept.

 

Wittry, D.B.

New developments in hardware for microbeam analysis

Dept. Materials Sci. & Engr., Univ. Southern California, L.A., CA

 

Newbury, D.E.

Microanalysis from the other side - relating microscopic measurements to bulk analysis

NIST, Microanalysis Res. Group, Gaithersburg, MD

 

Quantitative Microprobe Analysis

Chairs: R. Marinenko, R. Myklebust, D. Newbury,

D. Joy

 

Marinenko, R.B.

Has automation taken the worry out of quantitative wavelength dispersive microanalysis?

Surf. & Microanalysis Sci. Div., NIST, Gaithersburg, MD

 

Armstrong, J.T.

Effects of carbon coat thickness and contamination on quantitative analysis: a new look at an old problem

Caltech, Geol. Dept.

 

Harrowfield, I.R.

Comparison of measured and simulated Bremsstrahlung spectra to test electron energy loss expressions

CSIRO, Dept. of Mineral Products, Port Melbourne, Vic., Australia

 

Joy, D.C.

A data base on electron-solid interactions

Univ. Tenn., EM Facility

 
     

27th MEETING OF THE MICROBEAM ANALYSIS SOCIETY

 

Loyola Marymount University

Marina del Rey / Los Angeles, California

July 11-16, 1993

 

MAS-AEM Meeting Presentations

 

(The presenting authors, listed below, will be contacted concerning the date, time, and location of their talks.)

 

MAS Symposia and Sessions:

 

Plenary Lecture

Chairs: D. Wittry and T. Huber

 

Scharf, D.

Imagery, Art and the SRM

David Scharf, Los Angeles, CA

 

Presidential Symposium: MicrobeamsHere, There and Everywhere

Chair: T. Huber

 

Huber, T.

The necessity of interaction between the scientific and commercial communities

JEOL U.S.A., Inc.

 

Ogilvie, R.E.

Microanalysis of historical objects

Museum of Fine Arts, Boston

 

Goldstein, J.I.

Microbeam analysis in the university

Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA

 
       

       

Gauvin, R.

The transition between persistent and random walk process to describe electron scattering in solids: a status report

Univ. Sherbrooke, Genie mecanique, Quebec

 

Sartore, R.G.

Effect of accelerating voltage on spatial resolution of linewidth measurements on an IC using energy dispersive x-ray analysis

US Army Res. Lab., Fort Monmouth, NJ

 

Waldo, R.A.

Applications of the electron probe to thin film analysis

GM Res. & Dev. Center, Anal. Chem., Warren, MI

 

Armstrong, J.T.

Experimental determination of polynomial a-factors for quantitative electron microbeam analysis of silicates and oxides

Caltech, Geol. Dept.

 

Nockolds, C.E.

Low voltage x-ray microanalysis using a UTW EDS in an in-lens FEGSEM

Univ. Sydney, E.M. Unit, Sidney, NSW, Australia

 

Griffin, B.

EDS detectors: long term performance and procedures for minimizing window contamination in the analytical SEM

Centre for Micros. & Microanal., Univ. of W. Australia, Nedlands, WA

 

Cousens, D.R.

The light element analysis performance of the JEOL 8800L electron microprobe

Centre for Micros. & Microanal., Univ. of Queensland, Brisbane, Aust

 

Ross, D.K.

Oxygen analysis by EPMA: the need for internally consistent mass absorption coefficients

Univ. Houston, Texas Center for Superconductivity, Houston TX

 

Quantitation in the Environmental SEM

Chair: D. Newbury and D. Joy

 

Doehne, E.

Empirical evaluation of the electron skirt in the environmental SEM: implications for energy dispersive x-ray analysis

Getty Conservation Institute, Marina del Rey, CA

Griffin, B.

X-ray resolution at low chamber pressures and chamber gas fluorescence in the Electroscan ESEM

Centre for Micros. & Microanal., Univ. of W. Australia, Nedlands, WA

 

Doehne, E.

Experimental conditions for semi-quantitative SEM/EDS of painting cross sections using the environmental scanning electron microscope

Getty Conservation Institute, Marina del Rey, CA

 

Image Analysis and Compositional Mapping

Chairs: J. Porter and P. Carpenter

 

Adams, B.L.

Orientation imaging microscopy: A new tool for interogating the fields of lattice orientation in polycrystalline materials

Brigham Young Univ., Man. Engr., Provo, UT

 

Morris, W. and James, M.

High resolution deformation and strain field analysis using HASMAP

Rockwell International Science Center, Thousand Oaks, CA

 

Kobayashi, T.

Use of fracture surface topography in fracture analyses

Dept. Metallurgy & Frac. Mech., SRI International, Menlo Park, CA

 

Harrowfield, I.R.

Chemical imaging on electron microprobes

CSIRO, Dept. of Mineral Products, Port Melbourne, Vic., Australia

 

Browning, R.

Re-defining signal-to-noise in multi-spectral images

Dept. of Electrical Engr., Stanford Univ., Stanford, CA

 

New and Emerging Techniques

Chair: D. Wittry

 

Atwater, H.A.

In situ surface chemical analysis during molecular beam epitaxy by reflection electron energy loss spectroscopy

Div. of Appl. Phys., Caltech, Pasadena, CA

 

Moyer, P.J.

Sheer force/reflection near-field scanning optical microscopy (NSOM)

Topometrix, Santa Clara, CA

       

       

STM/AFM

Chair: P. Russell

 

Campbell, J.B. and Lankford, J.

Atomic force microscopy of surfaces

Southwest Res. Inst., San Antonio, TX

 

Prater, C.

AC methods in atomic force microscopy

Digital Instruments, Inc., Santa Barbara, CA

 

Mooney, C.B.

Effects of deformation of electron beam grown microtips on measurements taken with the atomic force microscope

Dept. Materials Sci. & Engr., North Carolina State Univ., Raleigh, NC

 

Micro-FTIR Analysis

Chairs: J. Reffner and S. Hill

 

Reffner, J.A.

Infrared microprobe analysis: its capabilities and limitations for materials characterization

Spectra-Tech, Inc., Stamford, CT

 

Katon, J.E.

Quantitative analysis of colorants in single polypropylene fibers using molecular microspectroscopy

Miami Univ., Chem. Dept., Oxford, OH

 

Derrick, M.

Applications of IR microspectrometry to the analysis of binding media in paint layers on easel paintings and polychrome sculptures

Getty Conservation Institute, Marina del Rey, CA

 

Hill, S.L.

IR microreflectance principal component analysis: detection and resolution below the diffraction limit

Bio-Rad Laboratories, Digilab Division, Cambridge, MA

 

Martoglio, P.A.

Quantitative infrared microprobe analysis of biological tissue using a synthetic model

Spectra-Tech, Inc., Stamford, CT

 

Hill, S.L.

The selective analysis of anisotropic species using infrared microdichroic polarization

Bio-Rad Laboratories, Digilab Division, Cambridge, MA

Micro-X-ray Diffraction and Fluorescence

Chair: B. York

 

Carpenter, D.A.

Nondestructive microanalysis with a laboratory-based x-ray microprobe

Martin Marietta Energy Systems, Oak Ridge, TN

 

Lai, B.

Microfocusing using phase zone plates in the hard x-ray regime and its applications

Adv. Photon Source Dept., Argonne Nat'l. Lab., Argonne, IL

 

Pianetta, P.

Detection limits for aluminum on silicon using synchrotron radiation total reflection x-ray fluorescence

SLAC, Stanford Synchrotron Radiation Laboratory, Stanford, CA

 

Rivers, M. L.

Synchrotron x-ray microprobe techniques

Brookhaven Nat'l. Lab., Upton, NY

 

Boehme, D.R.

Mineralogical analysis of soils and other geologic specimens using x-ray micro-fluorescence techniques

Materials Diagnostics Dept., Sandia Nat'l. Lab./CA, Livermore, CA

 

Jacobsen, C.

Generating high resolution microprobes with soft and not-so-soft x-rays

Dept. Phys., SUNY, Stony Brook, NY

 

DeHaven, P.W.

Stress mapping of patterned thin film structures using x-ray microbeam diffraction

IBM Corp., Hopewell Junction, NY

 

Bilderback, D.H.

X-ray diffraction and fluorescence applications with submicron beams made with glass capillary optics

CHESS, Cornell Univ., Ithaca, NY

 

Thompson, A.C.

Microanalysis with a synchroton-based x-ray microprobe

Centre for X-ray Optics, Lawrence Berkeley Lab., Berkeley, CA

     
       

 

York, B.R.

Analytical challenges in laboratory-based x-ray diffraction and fluorescence systems using micron scale beams with capillary optics

X-ray Materials Lab., IBM, San Jose, CA

 

Wherry, D.C. and Wong, R.

X-ray microfluorescence chemical imaging with analytical image processing and materials uniformity applications

Fisons Instruments, San Carlos, CA

 

Strategies of Surface Analysis

Chair: D. Simons

 

Simons, D.S.

Assessment of silicon wafer cleaning procedures by secondary ion mass spectrometry

National Inst. of Standards & Technology, Gaithersburg, MD

 

Chakel, J.A.

Microanalysis of surfaces with time-of-flight secondary ion mass spectrometry (TOF-SIMS)

Charles Evans & Associates, Redwood City, CA

 

Gijbels, R.

A laser microprobe Fourier transform mass spectrometer with external ion source for organic and inorganic microanalysis

Dept. of Chemistry, Univer. of Antwerp, Antwerp-Wilrijk, Belgium

 

Evans, C.A.

Strategies for surface and microanalysis: semiconductors

Charles Evans & Associates, Redwood City, CA

 

Odom, R.W.

Strategies for surface analysis: polymers, organics and biomaterials

Charles Evans and Assoc., Redwood City, CA

 

Joshi, A.

Surface and interface analysis of metallic materials

Lockeed R&D Division, Palo Alto, CA

 

Palenik, S.

The forensic examination of particles recovered from surfaces

Microtrace, Elgin, IL

Hurd, J.L.

Auger, EPMA, XPS and EBSP analysis of discolored Au/Ti/Cu multilayer thin film I/O pads

IBM Analytical Services, Hopewell Junction, NY

 

Biological Microanalysis: I. X-ray Microanalysis

Chairs: R. Warner and P. Ingram

 

Ingram, P.

Analytical imaging of the mitochondrion: probes of form and function

Div. of Physiology, Dept. of Cell Biology, Duke University Medical Center, Durham, NC

 

Saubermann, A.J.

Direct intracellular injection of Rb as a K tracer using electron probe x-ray microanalysis and digital imaging

SUNY Stony Brook, Dept. of Anesthesiology

 

Andrews, S.B.

Characterization of calcium release organelles in Purkinje cells by combined x-ray and mass analysis

Lab. of Neurobiology, DIR, INIDS, NIH, Bethesda, MD

 

Kirk, R.G.

The use of x-ray microanalysis to measure distribution of labeled molecules in cells

West Virginia Univ., Dept. Anatomy, Morgantown, WV

 

Biological Microanalysis: II. Imaging SIMS

Chairs: R. Warner and P. Ingram

 

Lazof, D.B.

SIMS determination of metal contamination and nutrient tracers in freeze-dried cryosections of plant roots

U.S. Dept. of Agriculture, Agric. Res. Serv., Oxford, NC

 

Chabala, J.M.

Analysis of biological materials with a scanning ion probe

Enrico Fermi Inst., Univ. of Chicago, Chicago, IL

 

Wood, M.C.

Molecular imaging with ion beams and lasers

Dept. of Chemistry, Princeton Univ., University Park, PA

 

Chandra, S.

Application of ion microscopy to biomedical studies

Dept. Chemistry, Cornell Univ., Ithaca, NY

 

Severin, K.

Extracting information from incrementally-grown biological structures

Dept. Geol. & Geophys., Univ. of Alaska, Fairbanks, AK


       

Materials Applications

Chairs: J. Friel and M. McCartney

 

Chen, W.

Use of focussed ion beam (FIB) in creating arrays of two- and three- dimensional structures in semiconductors: Ga+ FIB and Si

USC, Mater. Sci. Dept., L.A., CA

 

Chen, J-S

Interfacial reaction of Pt thin films on single-crystal (001) b-SiC

Caltech, Electrical Engineering

 

Evans, N.D.

Ion mixing of thin ZrO2 films on sapphire

Metals & Ceramics Div., Oak Ridge Nat'l. Lab., Oak Ridge, TN

 

Jayaram, R.

Applications of the atom probe field ion microscope to the atomic level characterization of metals and alloys

Metals & Ceramics Div., Oak Ridge Nat'l. Lab., Oak Ridge, TN

 

Reucroft, P.J.

A study on Al doped ZnO films grown by a low pressure metal organic chemical vapor deposition technique

Univ. Kentucky, Mat. Sci. & Engr., Lexington

 

Mosley, W.C.

Scanning electron microscopy in development of palladium deposited on Kieselguhr (Pd/K)

Westinghouse Savannah River Co.

 

Liu, D.R.

Influence of sample porosity on accuracy of microprobe analysis of major and minor elements in Cu-ZSM-5 zeolite

Ford Motor Co., Ford Res. Lab., West Bloomfield, MI

 

Warner, R.P.

Polymer localization within grafted cellulose fibers: Chemical and morphological alterations enhance absorbancy

Miami Valley Labs., Procter & Gamble Co., Cincinnati, OH

 

Cole, M.W.

Surface characterization of magnetron-ion-etched GaAs

Army Research Lab., Ft. Monmouth, NJ

Aerospace Materials

Chairs: D. Hardwick and K. Vecchio

 

Vecchio, K.S.

Microchemistry of aluminum metal-matrix composites

Dept. Appl. Mechanics & Engr. Sci., Univ. of Calif., San Diego, CA

 

Soni, K.K.

SIMS analysis of aerospace materials

Enrico Fermi Inst., Univ. of Chicago, Chicago, IL

 

Rhodes, C.G.

Transmission electron microscopy characterization of fiber/matrix interfaces in titanium/aluminide/SiC composites

Rockwell International Science Center, Thousand Oaks, CA

 

Vecchio, K.S.

Planar faults in plasma spray deposited MoS2

Dept. Appl. Mechanics & Engr. Sci., Univ. of Calif., San Diego, CA

 

Particles, Geological and Environmental Applications

Chairs: J. Small and J. Bradley

 

Raymond, R.

Application of scanning and transmission electron microscopies to understanding the dynamics of rock varnish formation

Los Alamos Nat'l., Lab., Los Alamos, NM

 

Hietala, S.L.

Observation of phases in hydrothermally treated aluminosilicate

Dept. Chem. & Nuclear Engr., Univ. New Mexico, Albuquerque, NM

 

Mikula, R.J.

Characterization of fine particulate suspensions: correlated confocal and cryo-SEM observation of oil sands tailings

CANMET, Western Research Centre, Devon, Alberta

 

Lee, R.J. and Kennedy, S.K.

Computer controlled SEM/EDS and spectrographic cathodoluminescence analysis of quartz silt

RJ Lee Group, Inc., Monroeville, PA

 

Small, J.A.

An evaluation of particle correction procedures applied to automated particle analysis

NIST, Chem. Sci. and Tech. Lab., Gaithersburg, MD

 
     
       

       

 

Zevenbergen C., Bradley, J.P. and Van Reeuwijk, L.P.

Mobility of heavy metals during leaching of municiple solid waste ash

MVA Inc., Norcross, GA

 

Kim, H.S.

The investigation of particulates collected after space shuttle landing at Dryden Flight Research Facility, CA

NASA, Kennedy Space Center

 

Joint MAS-AEM Symposium

Chuck Fiori Memorial Symposium: X-ray Spectrometry

Electron Beam Instruments

Chairs: D. Williams, J. Goldstein and D. Newbury

 

Fiori Memorial Symposium: I. EDS

 

Heinrich, K.F.J.

A history of energy dispersive electron probe microanalysis

Rockville, MD

 

Joy, D.C.

Modelling the Si(Li) energy dispersive x-ray detector

Univ. Tenn., EM Facility

 

Statham, P.J.

Quantifying benefits of resolution and count rate in EDX microanalysis

Microanalysis Group, Oxford Instruments, High Wycombe, Bucks., UK

 

Sareen, R.A.

Properties of germanium detectors

The University, Schuster Labs., Manchester, England

 

Iwanczyk, J.S. and Dabrowski, A.J.

Status of mercuric iodide x-ray technology

Xsirius, Inc., Marina del Rey, CA

 

Lund, M.W.

Current trends in Si(Li) detector windows for light element analysis

Moxtek, Orem, UT

 

Mott, R.A.

High count rate light-element EDS

PGT, Princeton, NY

 

McCarthy, J.

The effect of detector dead layers on light element detection in EDS

Noran Instruments, Middleton, WI

 

Newbury, D.E.

Artifacts in energy dispersive x-ray spectrometry

NIST, Microanalysis Res. Group, Gaithersburg, MD

 

Zemyan, S.M.

Characterizing an energy dispersive spectrometer on an analytical electron microscope

Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA

 

Michael, J.R.

Energy dispersive x-ray spectrometers in ultra-high vacuum environments

Sandia Nat'l. Labs., Div. 1822, Albuquerque, NM

 

Fiori Memorial Symposium: II. WDS

 

Reed, S.J.B.

Wavelength dispersive spectrometrypast, present and future

Univ. of Cambridge, Dept. of Earth Sciences

 

Bastin, G.F.

Synthetic multilayer crystals for EPMA of ultra-light elements

Lab. Sol. State Chem. & Mat. Sci., Univ. of Tech., Eindhoven, Neth.

 

Rybka, R. and Wolf, R.C.

Application of layered synthetic microstructured crystals for WDX microanalysis of ultra-light elements

Microspec Corp., Fremont, CA

 

Wittry, D.B.

New developments in curved diffractor geometries for x-ray microanalysis

Dept. Materials Sci. & Engr., Univ. Southern California, L.A., CA

 

Panin, A.M.

Von Hamoss type parallel collection wavelength dispersive spectrometer for microbeam analysis

Brigham Young Univ., Dept. Phys. & Astronomy, Provo UT

 

Moll, S.H.

Wavelength dispersive x-ray analysis in AMRAY field emission SEMs

AMRAY, Inc.

 

Franco, E.D.

An emerging wavelength dispersive technology for AEM

ARACOR, Sunnyvale, CA

     
       

       

 

Myklebust, R.L.

Fitting wavelength dispersive spectra in the NIST/NIH DTSA program

NIST, Gaithersburg, MD

 

Labar, J., Remond, G. and Myklebust, R.L.

Accurate separation of x-ray lines in measurement of relative intensities with wavelength dispersive spectrometers

Res. Inst. Tech. Phys., Hungarian Academy of Sci., Budapest, Hungary

 

AEM WORKSHOP

 

Quantitative STEM Imaging

Chairs: J. Chapman and S. Pennycook

 

Rodenburg, J.M.

Reducing uncertainties and improving resolution in coherent STEM imaging

Dept. Physics, Cavendish Lab., Cambridge, UK

 

Chapman, J.N.

STEM imaging with a segmented detector

Univ. of Glasgow, Dept. of Physics & Astronomy

 

Liu, J.

High-resolution STEM imaging

Arizona State Univ., Center for Solid State Sci., Tempe

 

Pennycook, S.J.

Z-contrast imaging with a 300 kV STEM

Oak Ridge Nat'l. Lab., Oak Ridge, TN

 

Hillyard, S. and Silcox, J.

Quantitative annular dark field STEM images

Cornell Univ., Dept. of Appl. & Eng. Physics, Ithaca, NY

 

Bonnet, N.

Applications of multivariate statistical analysis in microanalysis

Univ. of Reims, Inserm U314, Reims, France

 

Warner, R.P.

Qualitative water measurements from STEM images of biological tissue

Miami Valley Labs., Procter & Gamble Co., Cincinnati, OH

 

CBED Symposium

Chairs: K. Vecchio and J. Mansfield

 

Saunders, M.

Determination of bonding charge densities in silicon

Univ. of Bath, School of Physics

 

Swaminathan, S. and Fraser, H.L.

Measurement of low order structure factors in intermetallic compound TiAl using quantitative CBED method

Materials Sci. & Engr., Ohio State Univ., Columbus, OH

 

Lin, X. and Dravid, V.P.

Quantitative electron nanodiffraction from interfaces

Dept. Materials Sci. & Engr., Northwestern Univ., Evanston, IL

 

Burgess, W.G.

Polarity determination in semiconductors by zone-axis CBED

Univ. of Cambridge, Dept. Mat. Sci. & Engr.

 

Vecchio, K.S.

Dilatation versus shear effects in CBED techniques applied to TiAl-based lamellar composites

Dept. Appl. Mechanics & Engr. Sci., Univ. of Calif., San Diego, CA

 

Quantitative EDS

Chairs: J. Michael and G. L'Esperance

 

Hovington, P.

Processing and quantification of low energy EDS spectra and modeling of the decrease of detection efficiency with time

Ecole Polytechnique de Montreal, Cen. Char. & Micr. of Mat., Quebec

 

Gauvin, R.

Multifractal behavior of the effect of fast secondary electrons on spatial resolution of x-ray microanalysis in the TEM

Univ. Sherbrooke, Genie mecanique, Quebec

 

Anderson, I.M.

Correction of secondary fluorescence in the AEM for common specimen geometries

Univ. Minn., Chem. Engr. & Mat. Sci., Minneapolis, MN

 

McCarthy, J.

EDS artifacts in AEM revisited

Noran Instruments, Middleton, WI

     
       

       

 

Williams, D.B.

A new analytical electron microscope

Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA

 

Lyman, C.E.

Improved x-ray throughput by fast beam blanking in a 300 kV field emission AEM

Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA

 

Romig, A.D., Jr.

Spatial resolution in the AEM: measurement of and comparison with Monte Carlo calculations

Sandia Nat'l. Labs., Mater. & Process Sci., Albuquerque, NM

 

Ingram, P.

Quantitative EDS imaging in biology

Dept. Chem. & Life Sci., Research Triangle Inst., Res. Tri. Pk, NC

 

Zemyan, S.M.

Variables in calculated k-factors for AEM

Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA

 

Zemyan, S.M.

K-shell ionization cross sections for AEM

Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA

 

Solorzano, G.

High resolution observations of segregation in oxide grain boundaries

Center for Materials Sci. & Engr., MIT, Cambridge, MA

 

Koppel, E.D.

An emerging wavelength dispersive technology for AEM

ARACOR, Sunnyvale, CA

 

Alani, R.

Very low angle ion milling: an overview

Gatan, Inc.

 

Biological Microanalysis

Chairs: D. Johnson and R. Leapman

 

Andrews, S.B.

Characterization of cryosections in the FE-STEM: specimen damage during freeze-drying and analysis

Lab. of Neurobiology, DIR, INIDS, NIH, Bethesda, MD

   

Ingram, P.

Cryofixation of kidney for electron probe x-ray microanalysis

Dept. Chem. & Life Sci., Research Triangle Inst., Res. Tri. Pk, NC

 

Bond, M.

Statistical design and analysis in quantitative electron probe microanalysis in biology

Cardiovasc. Biol. Dept., Cleveland Clinic Foundation, Cleveland, OH

 

Cantino, M.E.

Radiation damage in biological freeze dried cryosections during electron probe x-ray microanalysis

Dept. of Physiology & Neurobiology, Univ. of Connecticut, Storrs, CT

 

Leapman, R.D.

Use of EELS to assess beam damage in biological microanalysis

Biomedical Engr. & Instrum. Program, NIH, Bethesda, MD

 

Shi, S.

EELS measurement of hydrated cryosection thickness

Biomedical Engr. & Instrum. Program, NIH, Bethesda, MD

 

Sun, S.

Parallel-EELS mapping of water distribution in cryosectioned cells

Biomedical Engr. & Instrum. Program, NIH, Bethesda, MD

 

Quantitative EELS

Chairs: J. Hunt and O. Krivanek

 

Rightor, E.

Polymer characterization in the STEM by EELS and comparison to synchrotron and gas phase EELS results

Dow Chemical U.S.A., Freeport, TX

 

Leapman, R.D.

Biological microanalysis by parallel-EELS

Biomedical Engr. & Instrum. Program, NIH, Bethesda, MD

 

Thiel, B.

EELS observations on natural silk fibers

Dept. Materials Sci. & Engr., Univ. of Washington, Seattle, WA

     
       

       

 

Browning, N.D.

Atomic resolution EELS in the STEM

Oak Ridge Nat'l. Lab., TN

 

Hunt, J.

Low-dose EELS and imaging strategies in STEM

Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA

 

Ahn, C.

Energy filtered imaging and RHEED

Dept. Materials Sci., Caltech, Pasadena, CA

 

Kundmann, M.K.

Processing of energy-filtered images for reduced noise in elemental maps

Gatan Inc., Downers Grove, IL

 

Dravid, V. P.

Quantitative EELS fine structure analysis of oxide superconductors

Dept. Materials Sci. & Engr., Northwestern Univ., Evanston, IL

 

Hunt, J.

Chemical microanalysis using EELS fingerprinting

Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA

 

Joy, D.C.

Quantitative analysis of the electron energy loss spectrum

Univ. Tenn., EM Facility

 

Bentley, J.

Microanalysis of directionally solidified cobalt oxide-zirconia eutectic

Metals & Ceramics Div., Oak Ridge Nat'l. Lab., Oak Ridge, TN

 

Newbury, D.E.

Trace nanoanalysis of nanophase magnetic ceramics by analytical electron microscopy with parallel detection EELS

NIST, Microanalysis Res. Group, Gaithersburg, MD

 

Wang, S.S. and Atwater, H.

Sn(3x1)/Si(110) reconstruction studies by reflection EELS and EXELFS analysis

Dept. Appl. Phys., Caltech, Pasadena, CA

   

CHUCK FIORI MEMORIAL

SCHOLARSHIP FUND

 

The Chuck Fiori Memorial Scholarship Fund has been enthusiastically responded to by many contributors, both individual and corporate. At current writing, there have been 35 such contributors and a total of $4255 given for this purpose. Notes accompanying the contributions have frequently expressed tragic personal loss at Chuck's passing as well as support for the Scholarship Fund as a way of ensuring continuation of Chuck's work and interests.

 

Harvey Freeman, Treasurer

     

TECHNICAL VIDEOTAPES

 

MAS members may rent the following technical videotapes. If you are interested, please contact:

 

Claudia Baker, Tape Librarian

Industrial Extension Service

North Carolina State University

Raleigh, NC

(919) 515-5358

 

EDS: The System and the Detector (Russell)

EDS: The Electronics (Russell)

Transmission Electron Microscopy of Crystals: Genesis

(Howie)

Spatially Localized Valence Electron Spectroscopy

(Howie)

Surface Imaging in Electron Microscopy (Howie)

Convergent Beam Diffraction (Eades)

AES, SAM, XPS (Hofmeister, MacKay)

SIMS, RBS (Griffis, Ray, Swanson)

IR, Raman, Ellipsometry (Irene, Lucovsky, Nemanich)

LEED, RHEED (Nemanich, Rozgonyi)

BSE, SE, ECP (Radzimski)

Photoluminescence, Photoconductivity,

Photoreflectance (Bachman)

TEM, SAD, EDS (Chevacharoenkul, Hren)

CBED, HREM, STEM (Maher, Narayan, Posthill)

IV, DLTS (Massoud, McLarty)

Channel Hot Electron, Junction Leakage, Oxide

Integrity, Electrically Active Defects

(Nicollian, Osburn, Reisman)

EBIC, BIV, CL, LBIC (Maher, Radzimski)

STM, FIM/AP, FEM (Hren, Russell)

     
       

         

 

3. The MAS 1993 Computer Workshop.

There will be a Computer Workshop and Software Exchange at this year's meeting. It will be slightly smaller in scale than the joint meetings with MSA. There will, however, be 3 MS-DOS computers and 3 Apple Macintoshes available for attendees to access the MAS Software Library. These computers will also be available for demonstrations of software written by attendees of the meeting. The same rules apply to the software used in these demonstrations as to that submitted to the library: they must be free or low-cost shareware (<$100 shareware fee). The MS-DOS computers at the meeting will be equipped with at least 4 megabytes of memory, VGA monitors, 3.5 inch floppy disk drives and large hard drives. The Macintoshes will have at least 4 megabytes of memory, 256 color monitors, 3.5 inch floppy disk drives and large hard drives. If any member wishes to demonstrate software that has special requirements, they should contact me as soon as possible and I will try to ensure that their needs are satisfied.

 

John F. Mansfield, Computer Committee Chair

North Campus Electron Microbeam Analysis Lab.

University of Michigan

2455 Hayward

Ann Arbor, MI 48109-2143

 

Phone: (313) 936-3352

FAX: (313) 763-5567

Email: John.F.Mansfield@umich.edu

MOUSIN' AROUND

COMPUTER ACTIVITIES

 

I have three quick topics to discuss in this issue:

1. The MSA-MAS Computer Bulletin Board.

2. Programs in the MAS Library.

3. The MAS 1993 Computer Workshop.

 

1. The MSA-MAS Computer Bulletin Board.

The joint MSA-MAS computer bulletin board system (BBS), that was started in July 1991 has been a great success. In fact, it has been so successful that it is proving to be too expensive for the society to support! No, that doesn't mean that the system is going to be closed down! It merely means that the toll-free 800 number that was initially used to access the BBS has been replaced by a regular phone number. The phone number for access is now: (708) 252-7917. The communications protocol for connecting to the BBS remains unchanged and is listed in Table 1. I apologize for any inconvenience that this number change may cause.

 

2. Programs in the MAS Library.

In an earlier article of Mousin' Around, I asked authors of programs in the MAS Software Library to send me updated documentation for their software, including a small abstract explaining exactly what their program does. I have not exactly been inundated by responses. In fact, I have not received any replies at all! Since MAS 1993 is fast approaching, I would appreciate some input from authors so that attendees of this year's Computer Workshop can more readily see what each program in the library is supposed to do. Many thanks in advance.

 
     
         

Table 1. MSA-MAS BBS Communications Protocols

         
         

       

MISSOURI, ILLINOIS, AND KANSAS MICROBEAM ANALYSIS SOCIETY

 

MIKMAS, the Missouri, Illinois and Kansas Microbeam Analysis Society, officially adopted its name during their second gathering in St. Louis last October. It was held at Monsanto Corporation and hosted by Don Parker. A tour of the electron beam instrumentation laboratories followed the business meeting where Louis Ross of the University of Missouri-Columbia was elected President. Other business topics included holding an annual meeting with CSEMS (the local MSA affiliate), soliciting corporate sponsors for financial support instead of individual dues as a measure to increase membership and encouraging students to participate by holding a presentation competition.

 

Glen Franti of Allied-Signal in Kansas City, Mike Hafften of 3M in Columbia, Dan Krimser of Washington University in St. Louis and Don Parker have been appointed as Directors of MIKMAS. Along with helping the President to organize our group, they have approved a recent suggestion by Don to award the outstanding student presentation with a trip to the national MAS meeting to present their paper. The next meeting will be jointly held with CSEMS on the campus of Sangamon State University in Springfield, IL on May 20th. John Friel will be our keynote speaker. For more information on this meeting or joining MIKMAS, contact Lou at (314) 882-4777 or write him at 101 Geological Sciences Bldg., Univ. of Missouri, Columbia, MO 65211.

 

Louis Ross, President, MIKMAS

1992 awardees are Stephen D. Fields, of the Botany-Microbiology Department of the University of Oklahoma, for his presentation entitled "Development of a spray freezing apparatus for the rapid cryofixation of a fragile, unicellular alga," and Jonathan Icenhower, of the School of Geology and Geophysics of the University of Oklahoma, for his presentation entitled "Behavior of lithophile trace elements and F in peraluminous granitic systems: an experimental study." Each student will receive $600 to support his studies and attendance at the national meetings. Mr. Fields has chosen to attend the 1993 MSA meeting and Mr. Icenhower will attend the 1993 MAS meeting.

 

OkSEM is currently considering a name change to embrace the widening spectrum of optical technologies.

 

Scott D. Russell, Secretary-Treasurer, OkSEM

     

METROPOLITAN

MICROSCOPY SOCIETY

 

The Metropolitan Section of the Microbeam Analysis Society has officially changed its name to "The Metropolitan Microscopy Society" (M2S). This was the result of a vote taken at their December 9th meeting. David S. Bright (NIST), Steven J. Pennycook (ORNL) and Nestor J. Zaluzec (ANL) were speakers at an M2S meeting held March 31st.

 

The M2S officers for the 1992-1993 season are:

Idajean M. Fisher, Chairman

IBM: T. J. Watson Research Center

P.O. Box 218, MS 30-008

Yorktown Heights, NY 10598

 

Jerry L. Lehman, Co-Chairman

Carl Zeiss Incorporated

#1 Zeiss Drive

Thornwood, NY 10594

 

John Weakliem, Secretary / Treasurer

Princeton Gamma-Tech Inc., Sales & Marketing

1200 State Road

Princeton, NJ 08540

 

Patricia M. Brady, Special Activities Committee

Hoechst Celanese Corporation Technical Center

P.O. Box 3700

Somerville, NJ 08876-1252

 

Idajean M. Fisher, Chairman 1992-1993, M2S

     

OKLAHOMA SOCIETY FOR ELECTRON MICROSCOPY

 

On April 16th and 17th, OkSEM conducted its annual spring workshop addressing the topic of confocal scanning microscopy. Dr. Keith McClung, a research scientist with the Noble Foundation and the Oklahoma Medical Research Foundation, presented lectures covering instrument theory, practice and applications. He also conducted an operational demonstration of the CSM using his Meridian Axis argon laser-equipped confocal microscope.

 

In November, OkSEM held its fourth annual student competition for the Timpano Award which provides funds to attend the national meetings of MSA or MAS. In the competition, the judges graded each candidate on the basis of seven major criteria and two candidates tied exactly! We are therefore pleased to support two first prizes. The

 
     
       

           

THE MICROBEAM ANALYSIS SOCIETY'S TOUR SPEAKER SCHEDULE FOR 1993

           
 

 

 

Respectfully submitted,

Paul F. Hlava, MAS Tour Speaker Coordinator

Dept. 1822, Sandia National Laboratories, Albuquerque, NM 87185

Phone (505) 844-1890, FAX (505) 844-1778

           

           

NEW SUSTAINING MEMBER

 

4pi Analysis, Inc.

high-performance low-cost scientific innovators

3500 Westgate Drive, Suite 403

Durham, North Carolina 27707

Phone: (919) 489-1757

Fax: (919) 489-1487

Email: go4pi@applelink.apple.com

 

4pi Analysis develops and markets Macintosh-based hardware and software tools for energy dispersive x-ray spectroscopy and imaging. Now in its third year, 4pi is entering a phase of controlled growth to expand customer support and facilitate new product development.

     

4pi's benchmark product, the Spectral Engine, was developed by Scott Davilla, 4pi founder, to enable users of the NIST/NIH Desktop Spectrum Analyzer software program to acquire spectra directly into their Macintosh computers. With ten plus years of experience in EDS hardware and software, Davilla was well qualified to undertake this project. Each of the first eight boards sold was painstakingly wire wrapped. The printed circuit board version of the Spectral Engine, in full production since January, 1992, has been sold to researchers in eight countries.

 

With the success of the Spectral Engine, 4pi will continue its Macintosh-based product development. New products are scheduled for introduction later this year and in early 1994.

           

       

MAS EXECUTIVE COUNCIL

       

 

Treasurer

Harvey A. Freeman

958 Long Pond Road

Brewster, MA 02631-1898

(508)896-9060

 

Secretary

David S. Simons

National Institute of Standards and Technology

Bldg. 222, Rm. A113

Gaithersburg, MD 20899

(301)975-3903 FAX: (301)216-1134

President

Thomas G. Huber

JEOL (USA) Inc.

11 Dearborn Road

Peabody, MA 01960

(508)535-5900 FAX:(508)536-2205

 

President-Elect

John A. Small

National Institute of Standards and Technology

Bldg. 222, Rm. A113

Gaithersburg, MD 20899

(301)975-3900 FAX: (301)216-1134

 

Past-President

David B. Williams

Department of Materials Science and Engineering

Whitaker Laboratory

5 East Packer Avenue

Lehigh University

Bethlehem, PA 18015-3195

(215)758-4224 FAX: (215)758-4244

 
     
       

DIRECTORS

       

 

Joseph R. Michael (1992-1994)

Sandia National Laboratories

Org. 1822 P.O. Box 5800

Albuquerque, NM 87185

(505)844-9115 FAX: (505)844-1778

 

Joanna L. Batstone (1993-1995)

IBM T.J. Watson Research Center

P.O. Box 218

Yorktown Heights, NY 10598

(914) 945-3778

 

Charles E. Lyman (1993-1995)

Department of Materials Science and Engineering

Whitaker Lab

5 East Packer Avenue

Lehigh University

Bethlehem, PA 18015

(215)758-4249 FAX: (215)258-4244

John R. Porter (1991-1993)

Rockwell International Science Center

P.O. Box 1085

Thousand Oaks, CA 91360

(805)373-4702 FAX: (805)373-4775

 

Phillip E. Russell (1991-1993)

Department of Materials Science and Engineering

P.O. Box 7916

North Carolina State University

Raleigh, NC 27695-7916

(919)515-7501 FAX: (919)515-2932

 

Dale E. Johnson (1992-1994)

Graduate School AG-10

University of Washington

Seattle, WA 98195

(206)543-5900 FAX: (206)685-3234

 
     
       

       

SUSTAINING MEMBERS

Our Sustaining Members Contribute Substantial Support to MAS

       

 

ElectroScan Corporation

66 Concord Street

Wilmington, MA 01887

(508)988-0055 FAX: (508)988-0062

Contact: Marshall W. Bates, Jr. / Tom Hardt

 

Energy Beam Sciences

P.O. Box 468, 11 Bowles Road

Agawam, MA 01001

(800)992-9037 (413)786-9322 FAX: (413)789-2786

Contact: Jeffrey A. Ballou / Steven E. Slap

 

ETP-USA / Electron Detectors, Inc.

1650 Holmes Street, Building C

Livermore, CA 94550

(510)449-8534 FAX: (510)449-8996

Contact: Robert J. Ruscica

 

FEI Company

19500 N. W. Gibbs Drive, Suite 100

Beaverton, OR 97006-6907

(503)690-1500 FAX: (503)690-1519

Contact: Andree Kraker / Doug Rathkey

 

Fisons Instruments

P.O. Box 1409

San Carlos, CA 94070-1409

(415)591-3600 (508)524-1000

Contact: Joe Robinson / Mike Weiss

 

Gatan, Inc.

6678 Owens Drive

Pleasanton, CA 94588-3334

(510)463-0200 FAX: (510)463-0204

Contact: Larry Kolodziejski / Christopher Byrne

 

Geller Microanalytical Laboratory

One Intercontinental Way

Peabody, MA 01960

(508)535-5595 FAX: (508)535-7653

Contact: Joseph D. Geller

 

HNU X-ray Systems, Inc.

160 Charlemont Street

Newton, MA 02161-9987

(800)724-5600 (617)964-6690 FAX: (617)965-5812

Contact: Therese Hipple / Eugene Martin

4pi Analysis, Inc.

3500 Westgate Drive, Suite 403

Durham, NC 27707

(919)489-1757 FAX: (919)489-1487

Contact: Elizabeth Gregory / Scott Davilla

 

Advanced Microbeam, Inc.

4217 C Kings-Graves Road

Vienna, OH 44473

(216)394-1255 FAX: (216)394-1834

Contact: Pamela J. Lesher / Donald P. Lesher

 

Amray, Inc.

160 Middlesex Turnpike

Bedford, MA 01730

(617)275-1400 FAX: (617)275-0740

Contact: Kenneth Benoit / Sheldon Moll

 

Cameca Instruments, Inc.

2001 West Main Street

Stamford, CT 06902-4853

(203)348-5252 FAX: (203)348-5516

Contact: Andrew Davis / Sam Pindrys

 

Charles Evans & Associates

301 Chesapeake Drive

Redwood City, CA 94063

(415)369-4567

Contact: Donald H. Wayne / David A. Reed

 

Dapple Systems

355 West Olive, Suite 100

Sunnyvale, CA 94086

(408)733-3283 FAX: (408)736-2350

Contact: William Stewart

 

Denton Vacuum, Inc.

2 Pin Oak Avenue

Cherry Hill, NJ 08003

(609)424-1012 FAX: (609)424-0395

Contact: George Lutz / James L. Campbell

 

Electron Microscopy Sciences / Diatome US

321 Morris Road, P.O. Box 251

Fort Washington, PA 19034

(800)523-5874 (215)646-1566 FAX: (215)646-8931

Contact: Bang Nguyen / Stacie Kirsch

 
       

       

 

Horiba Instruments, Inc.

Micro-Analytical Division

1080 East Duane, Suite A

Sunnyvale, CA 94086

(408)730-4772 FAX: (408)730-8975

Contact: Nancy A. Wolfe

 

JEOL USA, Inc.

11 Dearborn Road

Peabody, MA 01960

(508)535-5900 FAX: (508)536-2205

Contact: Robert Santorelli / Charles Nielsen

 

Kratos Analytical, Inc.

535 E. Crescent Avenue

Ramsey, NJ 07446

(201)825-7500 FAX: (201)825-8659

Contact: David Surman

 

R. J. Lee Group, Inc.

350 Hochberg Road

Monroeville, PA 15146

(412)325-1776 FAX: (412)733-1799

Contact: David Crawford / Albert H. Beebe

 

Leica Instruments, Inc.

111 Deer Lake Road

Deerfield, IL 60015

(800)248-0123 (708)405-0123 FAX: (708)405-8139

Contact: Larry Bruder / Robert Brandom

 

Materials Analytical Services, Inc.

3597 Parkway Lane, Suite 250

Norcross, GA 30092

(800)421-8451 (404)448-3200 FAX: (404)368-8256

Contact: Mark Rigler / Bill Longo

 

McCrone Associates, Inc.

850 Pasquinelli Drive

Westmont, IL 60559

(708)887-7100 FAX: (708)887-7417

Contact: Kent L. Rhodes / John Gavrilovic

 

Micron, Inc.

3815 Lancaster Pike

Wilmington, DE 19805

(302)998-1184 FAX: (302)998-1836

Contact: James F. Ficca, Jr.

 

Microspec Corporation

45950 Hotchkiss Street

Fremont, CA 94539

(510)656-8820 FAX: (510)656-8944

Contact: Joseph Carr / William D. Donnelly

 

Nissei Sangyo America, Ltd.

Hitachi Scientific Instruments

460 E. Middlefield Road

Mountain View, CA 94043

(415)969-1100 FAX: (415)961-7259

Contact: Donna Armanino / Hideo Naito

 

NORAN Instruments, Inc.

2551 W. Beltline Highway

Middleton, WI 53562

(608)831-6511 FAX: (608)836-7224

Contact: Karen Roscoe / Mary Ales

 

Ovonic Synthetic Materials Co., Inc.

1788 Northwood

Troy, MI 48084

(800)366-1299 (313)362-1290 FAX: (313)362-4043

Contact: Susan Mamros / Nick Grupido

 

Oxford Instruments, Inc.

Microanalysis Group

601 Oak Ridge Turnpike

Oak Ridge, TN 37830

(800)769-3673 (615)483-8405 FAX: (615)483-5891

Contact: Graham Bird / Ron Sartin

 

Ted Pella, Inc.

P.O. Box 492477

Redding, CA 96049-2477

(916)243-2200

Contact: Robert B. Evans

 

Perkin-Elmer

Physical Electronics Division

6509 Flying Cloud Drive

Eden Prairie, MN 55344

(800)328-7515 (612)828-6100 FAX: (612)828-6322

Contact: Greg Carpenter

 

Philips Electronic Instruments

85 McKee Drive

Mahwah, NJ 07430

(201)529-3800

Contact: Nathan Little / John S. Fahy

 

Princeton Gamma-Tech

1200 State Road

Princeton, NJ 08540

(609)924-7310 FAX: (609)924-1729

Contact: Doug Skinner

     
       

       

 

SEM / TEC Laboratories, Inc.

4824 South 35th Street

Phoenix, AZ 85040

(602)276-6138 FAX: (602)276-4558

Contact: Sam Giallanza / Ed Holdsworth

 

Spectra-Tech / Nicolet

652 Glenbrook Road, P.O. Box 2190-G

Stamford, CT 06906

(203)357-7055

Contact: Jerry Hare / John A. Reffner

 

SPI Supplies / Structure Probe, Inc.

569 E. Gay Street, P.O. Box 656

West Chester, PA 19381-0656

(800)242-4774 (215)436-5400 FAX: (215)436-5755

Contact: Kim Royer / Andrew Blackwood

 

Topcon Technologies, Inc.

6940 Koll Center Parkway

Pleasanton, CA 94566-3100

(800)538-6850 (510)462-2212 FAX: (510)846-2803

Contact: Michael McCarthy / Bernard Sherman

 

Topometrix Corporation

1505 Wyatt Drive

Santa Clara, CA 95054

(408)982-9700 FAX: (408)982-9751

Contact: Tony Abbis / Paul West

 

Carl Zeiss, Inc.

Electron Optical Division

One Zeiss Drive

Thornwood, NY 10594

(800)356-1090

Contact: Art Dewey / Jerry Lehman

     
       
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